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参数资料
| 型号： | 5962-01A1701VXX |
| 厂商： | ATMEL CORP |
| 元件分类： | 微控制器/微处理器 |
| 英文描述： | 3 CHANNEL(S), 200M bps, SERIAL COMM CONTROLLER, QFP196 |
| 封装： | MQFP-196 |
| 文件页数： | 7/31页 |
| 文件大小： | 499K |
| 代理商： | 5962-01A1701VXX |
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15
TSS901E
Rev. C – 24-Aug-01
TCK
I
Test Clock. Provides an asynchronous clock for JTAG boundary
scan.
TMS
I
Test Mode Select. Used to control the test state machine.
TDI
I
Test Data Input. Provides serial data for the boundary scan
logic.
TDO
O/Z
Test Data Output. Serial scan output of the boundary scan
path.
350
RESET*
I
TSS901E Reset. Sets the TSS901E to a known state. This
input must be asserted (low) at power-up. The minimum width
of RESET low is 5 cycles of CLK10 in parallel with CLK
running.
CLK
I
External clock input to TSS901E (max. 25 Mhz).
Must be derived from RAM access time.
CLK10
I
External clock input to TSS901E DS-links (application specific,
nominal 10 Mhz). Used to generate to transmission speed and
link disconnect timeout.
PLLOUT
O
Output of internal PLL. Used to connect a network of external
RC devices.
VCC
Power Supply
GND
Ground
Signal Name
Type
Function
max. output
current [mA]
load [pF]
L
tCKH
tCKL
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