参数资料
型号: 932S421CFLFT
厂商: INTEGRATED DEVICE TECHNOLOGY INC
元件分类: 时钟产生/分配
英文描述: 400 MHz, PROC SPECIFIC CLOCK GENERATOR, PDSO56
封装: ROHS COMPLIANT, MO-118, SSOP-56
文件页数: 13/23页
文件大小: 242K
代理商: 932S421CFLFT
20
Integrated
Circuit
Systems, Inc.
ICS932S421C
1460E—08/25/09
The time from the de-assertion of PD or until power supply ramps to get stable clocks will be less than 1.8ms. If the drive
mode control bit for PD tristate is programmed to '1' the stopped differential pair must first be driven high to a minimum of
200mV in less than 300
s of PD deassertion.
PD De-assertion
PD
Tstable
<1.8mS
Tdrive_PwrDwn#
<300
S, >200mV
CPU, 133MHz
CPU#, 133MHz
SRC, 100MHz
SRC# 100MHz
USB, 48MHz
PCI, 33MHz
REF, 14.31818
Test Clarification Table
Comments
FS_C/TEST
_SEL
HW PIN
FS_B/TEST
_MODE
HW PIN
TEST
ENTRY
BIT
B6b6
REF/N or
HI-Z
B6b7
OUTPUT
0X
NORMAL
10
X
0
HI-Z
10
X
1
REF/N
11
X
0
REF/N
11
X
1
REF/N
0X
1
0
HI-Z
0X
1
REF/N
B6b6: 1= ENTER TEST MODE, Default = 0 (NORMAL OPERATION)
B6b7: 1= REF/N, Default = 0 (HI-Z)
HW
SW
Power-up w/ TEST_SEL = 1 to enter test mode
Cycle power to disable test mode
FS_C./TEST_SEL -->3-level latched input
If power-up w/ V>2.0V (-0.3V) then use TEST_SEL
If power-up w/ V<2.0V (-0.3V) then use FS_C
FS_B/TEST_MODE -->low Vth input
TEST_MODE is a real time input
If TEST_SEL HW pin is 0 during power-up,
test mode can be invoked through B6b6.
If test mode is invoked by B6b6, only B6b7
is used to select HI-Z or REF/N
FS_B/TEST_Mode pin is not used.
Cycle power to disable test mode, one shot control
相关PDF资料
PDF描述
932S421CGLFT 400 MHz, PROC SPECIFIC CLOCK GENERATOR, PDSO56
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