参数资料
型号: AD5045BRUZ-REEL7
厂商: Analog Devices Inc
文件页数: 7/28页
文件大小: 0K
描述: IC DAC DUAL 14BIT SPI 14TSSOP
产品培训模块: Data Converter Fundamentals
DAC Architectures
标准包装: 1,000
系列: nanoDAC™
设置时间: 5.8µs
位数: 14
数据接口: 串行,SPI?
转换器数目: 2
电压电源: 单电源
功率耗散(最大): 13.5mW
工作温度: -40°C ~ 125°C
安装类型: 表面贴装
封装/外壳: 14-TSSOP(0.173",4.40mm 宽)
供应商设备封装: 14-TSSOP
包装: 带卷 (TR)
输出数目和类型: 2 电压,单极;2 电压,双极
采样率(每秒): *
AD5025/AD5045/AD5065
Rev. 0 | Page 15 of 28
TERMINOLOGY
Relative Accuracy
For the DAC, relative accuracy, or integral nonlinearity (INL), is
a measure of the maximum deviation in LSBs from a straight
line passing through the endpoints of the DAC transfer
function. Figure 6, Figure 7, and Figure 8 show plots of typical
INL vs. code.
Differential Nonlinearity
Differential nonlinearity (DNL) is the difference between the
measured change and the ideal 1 LSB change between any two
adjacent codes. A specified differential nonlinearity of ±1 LSB
maximum ensures monotonicity. This DAC is guaranteed mono-
tonic by design. Figure 9, Figure 10, and Figure 11 show plots of
typical DNL vs. code.
Offset Error
Offset error is a measure of the difference between the actual
VOUT and the ideal VOUT, expressed in millivolts in the linear
region of the transfer function. Offset error is measured on the
part with Code 512 (AD5065), Code 128 (AD5045), and Code 32
(AD5025) loaded into the DAC register. It can be negative or
positive and is expressed in millivolts.
Offset Error Drift
Offset error drift is a measure of the change in offset error with
a change in temperature. It is expressed in microvolts per degree
Celsius.
Gain Error
Gain error is a measure of the span error of the DAC. It is the
deviation in slope of the DAC transfer characteristic from the
ideal, expressed as a percentage of the full-scale range.
Gain Temperature Coefficient
Gain error drift is a measure of the change in gain error with
changes in temperature. It is expressed in parts per million of
full-scale range per degree Celsius. Measured with VREF < VDD.
Full-Scale Error
Full-scale error is a measure of the output error when full-scale
code (0xFFFF) is loaded into the DAC register. Ideally, the
output should be VDD 1 LSB. Full-scale error is expressed as a
percentage of the full-scale range.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nanovolt-
seconds and is measured when the digital input code is changed
by 1 LSB at the major carry transition (0x7FFF to 0x8000). See
DC Power Supply Rejection Ratio (PSRR)
PSRR indicates how the output of the DAC is affected by changes
in the supply voltage. PSRR is the ratio of the change in VOUT to
a change in VDD for full-scale output of the DAC. It is measured
in decibels. VREF is held at 2.5 V, and VDD is varied ±10%.
Measured with VREF < VDD.
DC Crosstalk
DC crosstalk is the dc change in the output level of one DAC in
response to a change in the output of another DAC. It is measured
with a full-scale output change on one DAC (or soft power-down
and power-up) while monitoring another DAC kept at midscale.
It is expressed in microvolts.
DC crosstalk due to load current change is a measure of the
impact that a change in load current on one DAC has to another
DAC kept at midscale. It is expressed in microvolts per milliamp.
Reference Feedthrough
Reference feedthrough is the ratio of the amplitude of the signal
at the DAC output to the reference input when the DAC output
is not being updated (that is, LDAC is high). It is expressed in
decibels.
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into
the analog output of a DAC from the digital input pins of the
device but is measured when the DAC is not being written to
(SYNC held high). It is specified in nanovolt-seconds. It is
measured with one simultaneous data and clock pulse loaded
to the DAC.
Digital Crosstalk
Digital crosstalk is the glitch impulse transferred to the output
of one DAC at midscale in response to a full-scale code change
(all 0s to all 1s or vice versa) in the input register of another
DAC. It is measured in standalone mode and is expressed in
nanovolt-seconds.
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相关代理商/技术参数
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AD504KH 制造商:Rochester Electronics LLC 功能描述:- Bulk
AD504LH 制造商:Rochester Electronics LLC 功能描述:- Bulk
AD504MH 制造商:Rochester Electronics LLC 功能描述:- Bulk
AD504SH 制造商:Rochester Electronics LLC 功能描述:- Bulk
AD505-00E 功能描述:SENSOR MAG SW 40G STANDRD 8-MSOP 制造商:nve corp/sensor products 系列:AD 包装:管件 零件状态:有效 功能:全极开关 技术:霍尔效应 极化:任意一种 感应范围:±5mT 跳闸,±2.5mT 释放 测试条件:-40°C ~ 125°C 电压 - 电源:4.5 V ~ 30 V 电流 - 电源(最大值):4.5mA 电流 - 输出(最大值):20mA 输出类型:开路集电极 特性:- 工作温度:-40°C ~ 125°C(TA) 封装/外壳:8-TSSOP,8-MSOP(0.118",3.00mm 宽) 供应商器件封装:8-MSOP 标准包装:1,000