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参数资料
| 型号： | AD5064ARUZ-1REEL7 |
| 厂商： | Analog Devices Inc |
| 文件页数： | 9/28页 |
| 文件大小： | 0K |
| 描述： | IC DAC 16BIT 4CH BUF OUT 14TSSOP |
| 产品培训模块： | Data Converter Fundamentals DAC Architectures |
| 标准包装： | 1,000 |
| 系列： | nanoDAC™ |
| 设置时间： | 5.8µs |
| 位数： | 16 |
| 数据接口： | 串行 |
| 转换器数目： | 4 |
| 电压电源： | 单电源 |
| 功率耗散（最大）： | 30mW |
| 工作温度： | -40°C ~ 125°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 14-TSSOP（0.173"，4.40mm 宽） |
| 供应商设备封装： | 14-TSSOP |
| 包装： | 带卷 (TR) |
| 输出数目和类型： | 4 电压，双极 |
| 采样率（每秒）： | 125k |
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Data Sheet
AD5024/AD5044/AD5064
Rev. F | Page 17 of 28
TERMINOLOGY
Relative Accuracy (INL)
For the DAC, relative accuracy, or integral nonlinearity (INL),
is a measure of the maximum deviation in LSBs from a straight
line passing through the endpoints of the DAC transfer function.
Figure 8, Figure 9, and Figure 10 show plots of typical INL vs.
code.
Differential Nonlinearity (DNL)
DNL is the difference between the measured change and the
ideal 1 LSB change between any two adjacent codes. A specified
differential nonlinearity of ±1 LSB maximum ensures monoto-
nicity. This DAC is guaranteed monotonic by design. Figure 11,
Figure 12, and Figure 13 show plots of typical DNL vs. code.
Offset Error
Offset error is a measure of the difference between the actual
VOUT and the ideal VOUT, expressed in millivolts in the linear
region of the transfer function. Offset error is calculated using
a reduced code range—AD5064/AD5604-1: Code 512 to Code
65,024; AD5044: Code 128 to Code 16,256; AD5024: Code 32 to
Code 4064, with output unloaded. Offset error can be negative or
positive and is expressed in millivolts.
Gain Error
Gain error is a measure of the span error of the DAC. It is the
deviation in slope of the DAC transfer characteristic from the
ideal, expressed as a percentage of the full-scale range.
Offset Error Temperature Coefficient
Offset error temperature coefficient is a measure of the change
in offset error with a change in temperature. It is expressed in
microvolts per degree Celsius.
Gain Temperature Coefficient
Gain error drift is a measure of the change in gain error with
changes in temperature. It is expressed in parts per million of
full-scale range per degree Celsius.
Full-Scale Error
Full-scale error is a measure of the output error when full-scale
code (0xFFFF) is loaded into the DAC register. Ideally, the
output should be VREF 1 LSB. Full-scale error is expressed as a
percentage of the full-scale range. Measured with VREF < VDD.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nanovolt-
seconds and is measured when the digital input code is changed
by 1 LSB at the major carry transition (0x7FFF to 0x8000). See
DC Power Supply Rejection Ratio (PSRR)
PSRR indicates how the output of the DAC is affected by changes
in the supply voltage. PSRR is the ratio of the change in VOUT to
a change in VDD for full-scale output of the DAC. It is measured
in decibels. VREF is held at 2.5 V, and VDD is varied by ±10%.
Measured with VREF < VDD.
DC Crosstalk
DC crosstalk is the dc change in the output level of one DAC in
response to a change in the output of another DAC. It is measured
with a full-scale output change on one DAC (or soft power-down
and power-up) while monitoring another DAC kept at midscale.
It is expressed in microvolts.
DC crosstalk due to load current change is a measure of the
impact that a change in load current on one DAC has to another
DAC kept at midscale. It is expressed in microvolts per milliamp.
Reference Feedthrough
Reference feedthrough is the ratio of the amplitude of the signal
at the DAC output to the reference input when the DAC output
is not being updated (that is, LDAC is high). It is expressed in
decibels.
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into
the analog output of a DAC from the digital input pins of the
device, but it is measured when the DAC is not being written
to (SYNC held high). It is specified in nanovolt-seconds and
measured with one simultaneous data and clock pulse loaded
to the DAC.
Digital Crosstalk
Digital crosstalk is the glitch impulse transferred to the output
of one DAC at midscale in response to a full-scale code change
(all 0s to all 1s or vice versa) in the input register of another
DAC. It is measured in standalone mode and is expressed in
nanovolt-seconds.
Analog Crosstalk
Analog crosstalk is the glitch impulse transferred to the output
of one DAC due to a change in the output of another DAC. It is
measured by loading one of the input registers with a full-scale
code change (all 0s to all 1s or vice versa) while keeping LDAC
high, and then pulsing LDAC low and monitoring the output of
the DAC whose digital code has not changed. The area of the
glitch is expressed in nanovolt-seconds.
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| AD5064BRUZ | 功能描述:IC DAC 16BIT 4CH BUF OUT 16TSSOP RoHS:是 类别:集成电路 (IC) >> 数据采集 - 数模转换器 系列:nanoDAC™ 产品培训模块:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 标准包装:50 系列:- 设置时间:4µs 位数:12 数据接口:串行 转换器数目:2 电压电源:单电源 功率耗散（最大）:- 工作温度:-40°C ~ 85°C 安装类型:表面贴装 封装/外壳:8-TSSOP，8-MSOP（0.118"，3.00mm 宽） 供应商设备封装:8-uMAX 包装:管件 输出数目和类型:2 电压，单极 采样率（每秒）:* 产品目录页面:1398 (CN2011-ZH PDF) |
| AD5064BRUZ-1 | 功能描述:IC DAC 16BIT 4CH BUF OUT 14TSSOP RoHS:是 类别:集成电路 (IC) >> 数据采集 - 数模转换器 系列:nanoDAC™ 产品培训模块:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 标准包装:50 系列:- 设置时间:4µs 位数:12 数据接口:串行 转换器数目:2 电压电源:单电源 功率耗散（最大）:- 工作温度:-40°C ~ 85°C 安装类型:表面贴装 封装/外壳:8-TSSOP，8-MSOP（0.118"，3.00mm 宽） 供应商设备封装:8-uMAX 包装:管件 输出数目和类型:2 电压，单极 采样率（每秒）:* 产品目录页面:1398 (CN2011-ZH PDF) |
| AD5064BRUZ-1REEL7 | 功能描述:IC DAC 16BIT 4CH BUF OUT 14TSSOP RoHS:是 类别:集成电路 (IC) >> 数据采集 - 数模转换器 系列:nanoDAC™ 产品培训模块:Data Converter Fundamentals DAC Architectures 标准包装:750 系列:- 设置时间:7µs 位数:16 数据接口:并联 转换器数目:1 电压电源:双 ± 功率耗散（最大）:100mW 工作温度:0°C ~ 70°C 安装类型:表面贴装 封装/外壳:28-LCC（J 形引线） 供应商设备封装:28-PLCC（11.51x11.51） 包装:带卷 (TR) 输出数目和类型:1 电压，单极；1 电压，双极 采样率（每秒）:143k |
| AD5064BRUZ-REEL7 | 功能描述:IC DAC 16BIT 4CH BUF OUT 16TSSOP RoHS:是 类别:集成电路 (IC) >> 数据采集 - 数模转换器 系列:nanoDAC™ 产品培训模块:Data Converter Fundamentals DAC Architectures 标准包装:750 系列:- 设置时间:7µs 位数:16 数据接口:并联 转换器数目:1 电压电源:双 ± 功率耗散（最大）:100mW 工作温度:0°C ~ 70°C 安装类型:表面贴装 封装/外壳:28-LCC（J 形引线） 供应商设备封装:28-PLCC（11.51x11.51） 包装:带卷 (TR) 输出数目和类型:1 电压，单极；1 电压，双极 采样率（每秒）:143k |
| AD5065 | 制造商:AD 制造商全称:Analog Devices 功能描述:Fully Accurate, 12-/14-/16-Bit, Dual, VOUT nanoDAC SPI Interface, 4.5 V to 5.5 V in a TSSOP |
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