参数资料
型号: AD5245BRJ50-RL7
厂商: ANALOG DEVICES INC
元件分类: 数字电位计
英文描述: 256-Position I2C Compatible Digital Potentiometer
中文描述: 50K DIGITAL POTENTIOMETER, 2-WIRE SERIAL CONTROL INTERFACE, 256 POSITIONS, PDSO8
封装: 2.90 X 3 MM, MO-178BA, SOT-23, 8 PIN
文件页数: 10/16页
文件大小: 995K
代理商: AD5245BRJ50-RL7
AD5245
TEST CIRCUITS
Figure 27 to Figure 35 illustrate the test circuits that define the
test conditions used in the product specification tables.
Rev. 0 | Page 10 of 16
V
MS
A
W
B
DUT
V+ = V
1LSB = V+/2
N
V+
Figure 27. Test Circuit for Potentiometer Divider Nonlinearity Error (INL, DNL)
NO CONNECT
I
W
V
MS
A
W
B
DUT
Figure 28. Test Circuit for Resistor Position Nonlinearity Error
(Rheostat Operation; R-INL, R-DNL)
V
MS1
I
W
= V
DD
/R
NOMINAL
V
MS2
V
W
R
W
= [V
MS1
– V
MS2
]/I
W
A
W
B
DUT
Figure 29. Test Circuit for Wiper Resistance
V
V
MS
%
DD
%
PSS (%/%) =
V+ = V
DD
PSRR (dB) = 20 LOG
10%
MS
( )
V
DD
V
A
V
MS
A
W
B
V+
Figure 30. Test Circuit for Power Supply Sensitivity (PSS, PSSR)
B
OP279
W
5V
V
OUT
OFFSET
GND
OFFSET
BIAS
A
DUT
V
IN
Figure 31. Test Circuit for Inverting Gain
B
A
V
IN
OP279
W
5V
V
OUT
OFFSET
GND
OFFSET
BIAS
DUT
Figure 32. Test Circuit for Noninverting Gain
+15V
–15V
W
A
2.5V
B
V
OUT
OFFSET
GND
DUT
AD8610
V
IN
Figure 33. Test Circuit for Gain vs. Frequency
W
B
V
SS
TO V
DD
DUT
I
SW
CODE = 0x00
R
SW
=
0.1V
I
SW
0.1V
Figure 34. Test Circuit for Incremental ON Resistance
W
B
V
CM
I
CM
A
NC
GND
NC
V
SS
V
DD
DUT
NC = NO CONNECT
Figure 35. Test Circuit for Common-Mode Leakage current
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