参数资料
型号: AD5320
厂商: Analog Devices, Inc.
英文描述: +2.7 V to +5.5 V, 140 uA, Rail-to-Rail Output 12-Bit DAC in a SOT-23
中文描述: 2.7 V至5.5 V,140微安,轨到轨输出12位DAC采用SOT - 23
文件页数: 5/12页
文件大小: 192K
代理商: AD5320
AD5320
–5–
REV. B
T E RMINOLOGY
Relative Accuracy
For the DAC, relative accuracy or Integral Nonlinearity (INL)
is a measure of the maximum deviation, in LSBs, from a straight
line passing through the endpoints of the DAC transfer func-
tion. A typical INL vs. code plot can be seen in Figure 2.
Differential Nonlinearity
Differential Nonlinearity (DNL) is the difference between the
measured change and the ideal 1 LSB change between any two
adjacent codes. A specified differential nonlinearity of
±
1 LSB
maximum ensures monotonicity. This DAC is guaranteed
monotonic by design. A typical DNL vs. code plot can be seen
in Figure 3.
Zero-Code E rror
Zero-code error is a measure of the output error when zero code
(000 Hex) is loaded to the DAC register. Ideally the output
should be 0 V. The zero-code error is always positive in the
AD5320 because the output of the DAC cannot go below 0 V.
It is due to a combination of the offset errors in the DAC and
output amplifier. Zero-code error is expressed in mV. A plot of
zero-code error vs. temperature can be seen in Figure 6.
Full-Scale E rror
Full-scale error is a measure of the output error when full-scale
code (FFF Hex) is loaded to the DAC register. Ideally the
output should be V
DD
– 1 LSB. Full-scale error is expressed in
percent of full-scale range. A plot of full-scale error vs. tempera-
ture can be seen in Figure 6.
Gain E rror
This is a measure of the span error of the DAC. It is the devia-
tion in slope of the DAC transfer characteristic from ideal
expressed as a percent of the full-scale range.
T otal Unadjusted E rror
Total Unadjusted Error (TUE) is a measure of the output error
taking all the various errors into account. A typical TUE vs.
code plot can be seen in Figure 4.
Zero-Code E rror Drift
This is a measure of the change in zero-code error with a
change in temperature. It is expressed in
μ
V/
°
C.
Gain E rror Drift
This is a measure of the change in gain error with changes in
temperature. It is expressed in (ppm of full-scale range)/
°
C.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nV secs
and is measured when the digital input code is changed by
1 LSB at the major carry transition (7FF Hex to 800 Hex). See
Figure 19.
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into the
analog output of the DAC from the digital inputs of the DAC
but is measured when the DAC output is not updated. It is
specified in nV secs and measured with a full-scale code
change on the data bus, i.e., from all 0s to all 1s and vice versa.
相关PDF资料
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AD5320BRM +2.7 V to +5.5 V, 140 uA, Rail-to-Rail Output 12-Bit DAC in a SOT-23
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AD5320* +2.7 V to +5.5 V. 140 uA. Rail-to-Rail Output 12-Bit DAC in a SOT-23
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