参数资料
| 型号： | AD669BRZ-REEL |
| 厂商： | Analog Devices Inc |
| 文件页数： | 6/12页 |
| 文件大小： | 0K |
| 描述： | IC DAC 16BIT MONO VREF 28-SOIC |
| 产品变化通告： | AD669 Improvement Change 11/Jul/2012 |
| 标准包装： | 1 |
| 系列： | DACPORT® |
| 设置时间： | 10µs |
| 位数： | 16 |
| 数据接口： | 并联 |
| 转换器数目： | 1 |
| 电压电源： | 双 ± |
| 功率耗散（最大）： | 625mW |
| 工作温度： | -40°C ~ 85°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 28-SOIC（0.295"，7.50mm 宽） |
| 供应商设备封装： | 28-SOIC W |
| 包装： | 标准包装 |
| 输出数目和类型： | * |
| 采样率（每秒）： | 167k |
| 其它名称： | AD669BRZ-REELDKR |
AD669
REV. A
–3–
TIMING CHARACTERISTICS
VCC = +15 V, VEE = –15 V, VLL = +5 V, VHI = 2.4 V, VLO = 0.4 V
Limit
–40 C to
–55 C to
Parameter
+25 C
+85 C
+125 C
Units
(Figure la)
tCS
40
50
55
ns min
tLI
40
50
55
ns min
tDS
30
35
40
ns min
tDH
10
15
ns min
tLH
90
110
120
ns min
tLW
40
45
ns min
(Figure lb)
tLOW
130
150
165
ns min
tHIGH
40
45
ns min
tDS
120
140
150
ns min
tDH
10
15
ns min
Specifications subject to change without notice.
Specifications in boldface are tested on all production units at final electrical
test. Results from those tests are used to calculate outgoing quality levels. All
min and max specifications are guaranteed. Those shown in boldface are tested
on all production units.
AC PERFORMANCE CHARACTERISTICS
Parameter
Limit
Units
Test Conditions/Comments
Output Settling Time
13
s max
20 V Step, TA = +25
°C
(Time to
±0.0008% FS
8
s typ
20 V Step, TA = +25°C
with 2 k
, 1000 pF Load)
10
s typ
20 V Step, TMIN
≤ T
A
≤ T
MAX
6
s typ
10 V Step, TA = +25
°C
8
s typ
10 V Step, TMIN ≤ TA ≤ TMAX
2.5
s typ
1 LSB Step, TMIN
≤ T
A
≤ T
MAX
Total Harmonic Distortion + Noise
A, B, S Grade
0.009
% max
0 dB, 1001 Hz; Sample Rate = 100 kHz; TA = +25
°C
A, B, S Grade
0.07
% max
–20 dB, 1001 Hz; Sample Rate = 100 kHz; TA = +25
°C
A, B, S Grade
7.0
% max
–60 dB, 1001 Hz; Sample Rate = 100 kHz; TA = +25°C
Signal-to-Noise Ratio
83
dB min
TA = +25°C
Digital-to-Analog Glitch Impulse
15
nV-s typ
DAC Alternately Loaded with 8000H and 7FFFH
Digital Feedthrough
2
nV-s typ
DAC Alternately Loaded with 0000H and FFFFH; CS High
Output Noise Voltage
120
nV/
√Hz typ
Measured at VOUT, 20 V Span; Excludes Reference
Density (1 kHz – 1 MHz)
Reference Noise
125
nV/
√Hz typ
Measured at REF OUT
Specifications subject to change without notice.
Specifications in boldface are tested on all production units at final electrical test. Results from those tests are used to calculate outgoing quality levels. All min and
max specifications are guaranteed. Those shown in boldface are tested on all production units.
(With the exception of Total Harmonic Distortion + Noise and Signal-to-Noise
Ratio, these characteristics are included for design guidance only and are not subject to test. THD+N and SNR are 100% tested.
TMIN
≤ T
A
≤ T
MAX, VCC = +15 V, VEE = –15 V, VLL = +5 V except where noted.)
DATA
LDAC
tDS
tDH
CS
tLW
t LH
L1
t
CS
t
L1
Figure 1a. AD669 Level Triggered Timing Diagram
DATA
t DS
tDH
CS AND/OR
L1, LDAC
TIE
CS AND/OR L1 TO GROUND OR TOGETHER WITH LDAC
t LOW
tHIGH
Figure 1b. AD669 Edge Triggered Timing Diagram
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