AD9070
–
4
–
REV. B
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD9070 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
Table I. Output Coding
Twos
Complement
Step
AIN
–
AIN
Code
OR
1024
1023
1022
513
512
511
1
0
–1
≥
0.512 V
0.511 V
0.510 V
0.001 V
0.000 V
–0.001 V
–0.511 V
–0.512 V
≤
–0.513 V
>511
511
510
1
0
–1
–511
–512
<512
01 1111 1111
01 1111 1111
01 1111 1110
00 0000 0001
00 0000 0000
11 1111 1111
10 0000 0001
10 0000 0000
10 0000 0000
1
0
0
0
0
0
0
0
1
ORDERING GUIDE
Model
Temperature Range Package Option*
AD9070BR
AD9070/PCB
5962-9756301HXC –55
°
C to +125
°
C
–40
°
C to +85
°
C
+25
°
C
R-28
Evaluation Board
DH-28
*DH = Ceramic DIP; R = Small Outline IC (SOIC).
ABSOLUTE MAXIMUM RATINGS*
V
EE
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –6 V
Analog Inputs . . . . . . . . . . . . . . . . . . . . . V
EE
–1 V to +1.0 V
Digital Inputs . . . . . . . . . . . . . . . . . . . . . . . . . . . V
EE
to 0.0 V
VREF IN, VREF OUT . . . . . . . . . . . . . . . . . . . . V
EE
to 0.0 V
Digital Output Current . . . . . . . . . . . . . . . . . . . . . . . . 20 mA
Operating Temperature . . . . . . . . . . . . . . . . –55
°
C to +125
°
C
Storage Temperature . . . . . . . . . . . . . . . . . . –65
°
C to +150
°
C
Maximum Junction Temperature . . . . . . . . . . . . . . . +175
°
C
Maximum Case Temperature . . . . . . . . . . . . . . . . . . +150
°
C
*Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions outside of those indicated in the operation
sections of this specification is not implied. Exposure to absolute maximum ratings
for extended periods may affect device reliability.
EXPLANATION OF TEST LEVELS
Test Level
I
– 100% production tested.
II – 100% production tested at +25
°
C and sample tested at
specified temperatures.
III – Sample tested only.
IV – Parameter is guaranteed by design and characterization
testing.
V – Parameter is a typical value only.
VI – 100% production tested at +25
°
C; guaranteed by design
and characterization testing for industrial temperature
range; 100% production tested at temperature extremes
for military devices.
WARNING!
ESD SENSITIVE DEVICE