参数资料
型号: ADE7518ASTZF8
厂商: Analog Devices Inc
文件页数: 5/128页
文件大小: 0K
描述: IC ENERGY METER MCU 8K 64LQFP
产品变化通告: Product Discontinuance 27/Oct/2011
特色产品: ADE7518: Single-phase Energy-Measurement IC
标准包装: 160
输入阻抗: *
测量误差: *
电压 - 高输入/输出: *
电压 - 低输入/输出: *
电流 - 电源: *
电源电压: *
测量仪表类型: *
工作温度: *
安装类型: 表面贴装
封装/外壳: 64-LQFP
供应商设备封装: 64-LQFP(10x10)
包装: 托盘
产品目录页面: 797 (CN2011-ZH PDF)

ADE7518
SPECIFICATIONS
V DD = 3.3 V ± 5%, AGND = DGND = 0 V, on-chip reference XTAL = 32.768 kHz, T MIN to T MAX = ?40°C to +85°C, unless otherwise noted.
ENERGY METERING
Table 1.
Parameter
Min
Typ
Max
Unit
Test Conditions/Comments
MEASUREMENT ACCURACY 1
Phase Error Between Channels
PF = 0.8 Capacitive
PF = 0.5 Inductive
Active Energy Measurement Error 2
AC Power Supply Rejection 2
Output Frequency Variation
DC Power Supply Rejection 2
Output Frequency Variation
Active Energy Measurement Bandwidth 1
Reactive Energy Measurement Error 2
V rms Measurement Error 2
V rms Measurement Bandwidth 1
I rms Measurement Error 2
I rms Measurement Bandwidth 1
±0.05
±0.05
0.1
0.01
0.01
8
0.5
0.5
3.9
0.5
3.9
Degrees
Degrees
% of reading
%
%
kHz
% of reading
% of reading
kHz
% of reading
kHz
37° phase lead
60° phase lag
Over a dynamic range of 1000 to 1 @ 25°C
V DD = 3.3 V + 100 mV rms/120 Hz
I P = V P = ±100 mV rms
V DD = 3.3 V ± 117 mV dc
Over a dynamic range of 1000 to 1 @ 25°C
Over a dynamic range of 100 to 1 @ 25°C
Over a dynamic range of 500 to 1 @ 25°C
ANALOG INPUTS
Maximum Signal Levels
Input Impedance (DC)
ADC Offset Error 2
770
±10
±1
±400
±400
mV peak
mV peak
mV
mV
V P ? V N differential input
I P ? I N differential input
PGA1 = PGA2 = 1
PGA1 = 16
Gain Error 2
Current Channel
Voltage Channel
Gain Error Match
?3
?3
±0.2
+3
+3
%
%
%
I P = 0.4 V dc or I P = 0.4 dc
Voltage channel = 0.4 V dc
CF1 AND CF2 PULSE OUTPUT
Maximum Output Frequency
13.5
kHz
V P ? V N = 400 mV peak, I P ? I N = 250 mV,
PGA1 = 2 sine wave
Duty Cycle
Active High Pulse Width
50
90
%
ms
If CF1 or CF2 frequency, >5.55 Hz
If CF1 or CF2 frequency, <5.55 Hz
1
2
These specifications are not production tested but are guaranteed by design and/or characterization data on production release.
See the Terminology section for definition.
Rev. 0 | Page 5 of 128
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