参数资料
型号: ADUC7039BCP6Z
厂商: Analog Devices Inc
文件页数: 23/92页
文件大小: 0K
描述: IC MCU ARM7 BATT SENSER 32LFCSP
标准包装: 1
系列: MicroConverter® ADuC7xxx
核心处理器: ARM7
芯体尺寸: 16/32-位
速度: 20.48MHz
连通性: LIN,SPI
外围设备: POR,温度传感器,WDT
输入/输出数: 6
程序存储器容量: 64KB(32K x 16)
程序存储器类型: 闪存
RAM 容量: 1K x 32
电压 - 电源 (Vcc/Vdd): 3.5 V ~ 18 V
数据转换器: A/D 2x16b
振荡器型: 内部
工作温度: -40°C ~ 115°C
封装/外壳: 32-VFQFN 裸露焊盘,CSP
包装: 托盘
Data Sheet
ADuC7039
Rev. D | Page 3 of 92
REVISION HISTORY
3/13—Rev.C to Rev. D
Changed Fixed 10 MHz Frequency to Default 10 MHz
Frequency (Throughout)..................................................................1
Changes to Features Section and Figure 1 .....................................1
Changes to Table 1 ............................................................................5
Changes to Table 4 ..........................................................................12
Changes to System Kernel Checksum Section............................24
Changes to Figure 9 ........................................................................25
Changes to ADCxOF Default Values ...........................................41
Changes to Figure 20 ......................................................................49
Changes to Sequence Example Section........................................50
Reorganized LIN Oscillator Calibration Section Layout...........56
Changes to Figure 22 and Table 44 ...............................................59
Changes to Table 59 ........................................................................80
Changes to High Voltage Status Register Function Description.. 81
Changes to Figure 31 ......................................................................83
Changes to Part Identification Section and Added Table 64......... 88
Updated Outline Dimensions........................................................91
Changes to Ordering Guide...........................................................91
Added Automotive Products Section ...........................................91
1/12—Rev.B to Rev. C
Changes to LVF Level Test Conditions/Comments .....................5
Changed Pin 25 from GPIO_4 to GPIO_4/IRQ1.......................10
Changes to Flash/EE Memory Security Section .........................22
Changes to Figure 9 ........................................................................25
Changes to Figure 22 and Table 44 ...............................................59
Changes to GPIO_4 Port Signal and Functionality (Table 49)..... 69
Changes to Figure 33 ......................................................................90
Updated Outline Dimensions........................................................91
8/10—Rev.A to Rev. B
Changes to Fast Temperature Conversion Mode Section..........46
Changes to Bit 4 Description (LINCON[6] Reference) in
Table 62.............................................................................................86
Changes to Part Identification Section.........................................87
6/10—Rev. 0 to Rev. A
Added SAEJ2602 to Features Section.............................................1
Changes to Table 2 ............................................................................9
Changes to Bit 2 and Bit 1 Descriptions in Table 34 ..................39
Changes to System Clocks Section ...............................................49
Added Syncronization of Timers across Asynchronous Clock
Domains Section, Figure 23, and Figure 24 ................................60
Added Programming the Timers Section....................................61
Changes to Recommended Schematic Text.................................89
3/10—Revision 0: Initial Version
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