参数资料
型号: AS1109 EB
厂商: ams
文件页数: 15/25页
文件大小: 0K
描述: BOARD EVAL AS1109
标准包装: 1
电流 - 输出 / 通道: 0.5 ~ 100 mA
输出及类型: 8,非隔离
输出电压: 0 ~ 15 V
特点: 过热保护,开路 LED,短路 LED,诊断
输入电压: 3 ~ 5.5 V
已供物品:
已用 IC / 零件: AS1109
AS1109
Datasheet - D e t a i l e d D e s c r i p t i o n
8.6.3
Detailed Shorted-LED Error Report
The detailed shorted-LED error report can be read out immediately after global error mode has been run (see Global Error Mode on page 10) .
Figure 17. Detailed Shorted-LED Error Report Timing Diagram
OEN
Global Flag Readout
t TESTING
Detailed Error Report Readout
LD
t SU(ERROR)
t H(L)
CLK
t GSW(ERROR)
t GSW(ERROR)
t GSW(ERROR)
t P4
SDI
t SW(ERROR)
DBit7
DBit6
DBit5
DBit4  DBit3
New Data Input
DBit2
DBit1
DBit0
Don’t
Care
SDO
T FLAG O FLAG
S FLAG
SBit7
SBit6
SBit5
SBit4
SBit3
SBit2
SBit1
SBit0
Don’t
Care
t P4
Shorted-LED Error Report Output
t P1
For detailed timing information see Timing Diagrams on page 8 .
Detailed Shorted-LED Error Report Example
Consider a case where five AS1109s are cascaded in one chain. A 1 indicates a LED is on, a 0 indicates a LED is off, and an X indicates a
shorted LED. This test is used with a test pattern where all LEDs are on at test time. Additionally, this test should be run after starting low-current
IC1:[11111XX1] IC2:[11111111] IC3:[11111111] IC4:[111X1111] IC5:[11111111]
IC2 has two shorted LEDs and IC4 has one shorted LED switched on due to input. 5*8 clock cycles are needed to write the entire error code out.
The detailed error report would look like this:
Input Data: 1 1 1 1 1 1 1 1
LED Status: 1 1 1 1 1 X X 1
Failure Code: 1 1 1 1 1 0 0 1
11111111
11111111
11111111
11111111
11111111
11111111
11111111
111X1111
11101111
11111111
11111111
11111111
Showing IC1 as the device with two shorted LEDs at position 6 and 7, and IC4 with one shorted LED at position 4.
Note: In an actual report there are no spaces in the output. LEDs turned off during test time cannot be tested.
8.6.4
Low-Current Diagnostic Mode
To run the open- or shorted-LED test, a test pattern must be used that will turn on each LED to be tested. This test pattern will cause a short
flicker on the screen while the test is being performed. The low-current diagnostic mode can be initiated prior to running a detailed error report to
reduce this on-screen flickering.
Note: Normally, displays using such a diagnosis mode require additional cables, resistors, and other components to reduce the current. The
AS1109 has this current-reduction capability built-in, thereby minimizing the number of external components required.
Low-current diagnostic mode can be initiated via 3 clock pulses during error-detection mode. After the falling edge of LD, a test pattern displaying
all 1s can be written to the shift register which will be used for the next error-detection test.
On the next falling edge of OEN, current is reduced to I LC . With the next rising edge of OEN the current will immediately increase to normal
levels and the detailed error report can be read out entering error-detection mode.
Revision 1.21
14 - 24
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