- 您现在的位置：买卖IC网 > Datasheet目录961 > AS1109 EB (ams)BOARD EVAL AS1109 Datasheet资料下载
参数资料
| 型号： | AS1109 EB |
| 厂商： | ams |
| 文件页数： | 18/25页 |
| 文件大小： | 0K |
| 描述： | BOARD EVAL AS1109 |
| 标准包装： | 1 |
| 电流 - 输出 / 通道： | 0.5 ~ 100 mA |
| 输出及类型： | 8，非隔离 |
| 输出电压： | 0 ~ 15 V |
| 特点： | 过热保护，开路 LED，短路 LED，诊断 |
| 输入电压： | 3 ~ 5.5 V |
| 已供物品： | 板 |
| 已用 IC / 零件： | AS1109 |
AS1109
Datasheet - A p p l i c a t i o n I n f o r m a t i o n
9.1.2
Error Detection with Low-Current Diagnosis Mode
This unique feature of the AS1109 uses an internal all 1s test pattern for a flicker free diagnosis of all LEDs. This error detection mode can be
Figure 21. Low-Current Diagnosis Mode with Internal All 1s Test Pattern – 128 Cascaded AS1109s
2μs Low-Current Diagnosis Mode
Display
SDI
Data0
Data1
Data1
Data2
SDO
GEF
O or S Error Code of
All 1s Test Patern
GEF
Temperature Error Code
3x Clocks Low-
Current Mode
Clock for Error Mode
1x/2x
CLK
OEN
LD
Load Internal All 1s Test Pattern
1024x
Rising Edge of OEN
Acquisition of Error Status
Falling Edge of LD; Error Register is cop-
ied into Shift Register
1024x
Current
≤ 100mA
≤ 0.8mA
≤ 100mA
GEF = Global Error Flag
Low-current diagnosis mode is started with 3 clock pulses during error detection mode. After the three pulses of CLK, a pulse of LD loads the
internal all 1s test pattern. Then OEN should be enabled for 2μs for testing. With the rising edge of OEN the test of the LEDs is stopped and
while LD is high the desired error mode can be selected with the corresponding clock pulses.
With the next data input the detailed error code will be clocked out at SDO.
Note: See Figure 22 for the use of an external test pattern.
Figure 22. Low-Current Diagnosis Mode with External Test Pattern – 128 Cascaded AS1109s
Display
SDI
Data1
External all 1s Test Pattern
2μs Low-Current Diagnosis Mode
Data2
Data2
Data3
SDO
T/O or S Error Code
Data0
3x Clocks
Low-Current
Mode
GEF
Clock for Error
Mode 1x/2x
O or S Error Code
from Test Pattern
GEF
Temperature Error Code
CLK
OEN
LD
Current
1024x
≤ 100mA
1024x
Rising Edge of OEN
Acquisition of Error Status
Falling Edge of LD; Error Register is cop-
ied into Shift Register
≤ 100mA
1024x
≤ 0.8mA
GEF = Global Error Flag
Revision 1.21
17 - 24
相关PDF资料 |
PDF描述 |
|---|---|
| AS1110 EB | BOARD EVAL AS1110 |
| AS1112 EB | BOARD EVAL AS1112 |
| AS1115 DB-YELLOW | BOARD DEMO AS1115 YELLOW |
| AS1116 DB-YELLOW | BOARD DEMO AS1116 YELLOW |
| AS3691A EB | BOARD EVAL AS3691A |
相关代理商/技术参数 |
参数描述 |
|---|---|
| AS1109-QF_EK_ST | 功能描述:AS1109 8, Non-Isolated Output LED Driver Evaluation Board 制造商:ams 系列:- 零件状态:有效 电流 - 输出/通道:100mA 输出和类型:8，非隔离 电压 - 输出:15V 特性:过热保护，开路 LED，短路 LED，诊断 电压 - 输入:3 V ~ 5.5 V 所含物品:板 使用的 IC/零件:AS1109 标准包装:1 |
| AS110R0JLF | 制造商:TT Electronics / IRC 功能描述:AS110R0JLF |
| AS110R2FLF | 制造商:TT Electronics / IRC 功能描述:AS110R2FLF |
| AS110R2HLF | 制造商:TT Electronics / IRC 功能描述:AS110R2HLF |
| AS110R2JLF | 制造商:TT Electronics / IRC 功能描述:AS110R2JLF |
发布紧急采购，3分钟左右您将得到回复。