参数资料
型号: AS1110 EB
厂商: ams
文件页数: 18/25页
文件大小: 0K
描述: BOARD EVAL AS1110
标准包装: 1
电流 - 输出 / 通道: 0.5 ~ 100 mA
输出及类型: 16,非隔离
输出电压: 0 ~ 15 V
特点: 过热保护,开路 LED,短路 LED,诊断
输入电压: 3 ~ 5.5 V
已供物品:
已用 IC / 零件: AS1110
AS1110
Datasheet - A p p l i c a t i o n I n f o r m a t i o n
9 Application Information
9.1 Error Detection
The AS1110 features two types of error detection. The error detection can be used on-the-fly, for active LEDs, without any delay, or by entering
into low-current diagnosis mode.
9.1.1
Error Detection On-The-Fly
Error detection on-the-fly will output the status of active LEDs during operation. Without choosing an error mode this will output the temperature
flag at every input/output cycle. Triggering one clock pulse for open or two clock pulses for short detection during error detection mode outputs
the detailed open- or short-error report with the next input/output cycle (see Figure 19) . LEDs turned off at test time are not tested and will show
a logic "1" at the detailed error report.
Figure 19. Normal Operation with Error Detection During Operation – 64 Cascaded AS1110s
Display
SDI
Data1
Data2
Data2
Data3
Data3
Data4
SDO
T/O or S Error Code Data0
Data0
GEF
T/O or S Error Code
Data1
GEF
T/O or S Error Code
Data2
Clock for Error
Clock for Error
CLK
1024x
Mode 0x/1x/2x
1024x
Mode 0x/1x/2x
1024x
OEN
Rising Edge of OEN
Acquisition of Error Status
Rising Edge of OEN
Acquisition of Error Status
LD
Current
Falling Edge of LD; Error Register is copied
into Shift Register
≤ 100mA
Falling Edge of LD; Error Register is copied
into Shift Register
GEF = Global Error Flag
9.1.2
Error Detection with Low-Current Diagnosis Mode
This unique feature of the AS1110 uses an internal all 1s test pattern for a flicker free diagnosis of all LEDs. This error detection mode can be
started at the end of each input cycle (see Figure 20) .
Figure 20. Low-Current Diagnosis Mode with Internal All 1s Test Pattern – 64 Cascaded AS1110s
Low-Current Diagnosis Mode
Display
SDI
Data0
Data1
Data1
Data2
Data2
Data3
GEF
SDO
T/O or S Error Code
Data0
GEF
O or S Error Code from
All 1s Test Pattern
GEF
Temperature Error Code
3x Clocks Low- Clock for Error Mode
Current Mode
1x/2x
CLK
1024x
1024x
1024x
Pattern
OEN
LD
Rising Edge of OEN
Acquisition of Error Status
Use Internal All 1s Test Falling Edge of LD; Error Register is cop-
ied into Shift Register
Current
≤ 100mA
≤ 0.8mA
≤ 100mA
GEF = Global Error Flag
Revision 1.6
17 - 24
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