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| 型号： | BX80557E2140 |
| 厂商： | INTEL CORP |
| 元件分类： | 微控制器/微处理器 |
| 英文描述： | MICROPROCESSOR, PBGA775 |
| 封装： | LGA-775 |
| 文件页数： | 17/107页 |
| 文件大小： | 1474K |
| 代理商： | BX80557E2140 |
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Datasheet
17
Electrical Specifications
The TESTHI signals may use individual pull-up resistors or be grouped together as
detailed below. A matched resistor must be used for each group:
TESTHI[1:0]
TESTHI[7:2]
TESTHI8/FC42 – cannot be grouped with other TESTHI signals
TESTHI9/FC43 – cannot be grouped with other TESTHI signals
TESTHI10 – cannot be grouped with other TESTHI signals
TESTHI11 – cannot be grouped with other TESTHI signals
TESTHI12/FC44 – cannot be grouped with other TESTHI signals
TESTHI13 – cannot be grouped with other TESTHI signals
However, use of boundary scan test will not be functional if these lands are connected
together. For optimum noise margin, all pull-up resistor values used for TESTHI[13:0]
lands should have a resistance value within ± 20% of the impedance of the board
transmission line traces. For example, if the nominal trace impedance is 50 Ω, then a
value between 40 Ω and 60 Ω should be used.
2.6
Voltage and Current Specification
2.6.1
Absolute Maximum and Minimum Ratings
Table 4 specifies absolute maximum and minimum ratings only and lie outside the
functional limits of the processor. Within functional operation limits, functionality and
long-term reliability can be expected.
At conditions outside functional operation condition limits, but within absolute
maximum and minimum ratings, neither functionality nor long-term reliability can be
expected. If a device is returned to conditions within functional operation limits after
having been subjected to conditions outside these limits, but within the absolute
maximum and minimum ratings, the device may be functional, but with its lifetime
degraded depending on exposure to conditions exceeding the functional operation
condition limits.
At conditions exceeding absolute maximum and minimum ratings, neither functionality
nor long-term reliability can be expected. Moreover, if a device is subjected to these
conditions for any length of time then, when returned to conditions within the
functional operating condition limits, it will either not function, or its reliability will be
severely degraded.
Although the processor contains protective circuitry to resist damage from static
electric discharge, precautions should always be taken to avoid high static voltages or
electric fields.
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相关代理商/技术参数 |
参数描述 |
|---|---|
| BX80557E2160 S LA8Z | 制造商:Intel 功能描述: |
| BX80557E4400 | 制造商:Intel 功能描述:MPU Core?2 Duo Processor E4400 65nm 2GHz 775-Pin FCLGA6 |
| BX80557E4500 S LA95 | 制造商:Intel 功能描述:MPU Core?2 Duo Processor E4500 65nm 2.2GHz 775-Pin FCLGA6 |
| BX80557E4600 S LA94 | 制造商:Intel 功能描述:MPU Core?2 Duo Processor E4600 65nm 2.4GHz 775-Pin FCLGA6 |
| BX80557E6300 | 制造商:Rochester Electronics LLC 功能描述: 制造商:Intel 功能描述: |
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