参数资料
型号: CY7C1481V25-100AXC
厂商: CYPRESS SEMICONDUCTOR CORP
元件分类: DRAM
英文描述: 72-Mbit (2M x 36/4M x 18/1M x 72) Flow-Through SRAM
中文描述: 2M X 36 CACHE SRAM, 8.5 ns, PQFP100
封装: 14 X 20 MM, 1.40 MM HEIGHT, LEAD FREE, PLASTIC, MS-026, TQFP-100
文件页数: 20/30页
文件大小: 1028K
代理商: CY7C1481V25-100AXC
CY7C1481V25
CY7C1483V25
CY7C1487V25
Document #: 38-05281 Rev. *H
Page 20 of 30
Capacitance
[15]
Parameter
Description
Test Conditions
100 TQFP
Package
165 FBGA
Package
209 FBGA
Package
Unit
C
ADDRESS
C
DATA
C
CTRL
C
CLK
C
I/O
Address Input Capacitance
T
A
= 25
°
C, f = 1 MHz,
V
DD
= 2.5V
V
DDQ
= 2.5V
6
6
6
pF
Data Input Capacitance
5
5
5
pF
Control Input Capacitance
8
8
8
pF
Clock Input Capacitance
6
6
6
pF
Input/Output Capacitance
5
5
5
pF
Thermal Resistance
[15]
Parameter
Description
Test Conditions
100 TQFP
Package
165 FBGA
Package
209 FBGA
Package
Unit
Θ
JA
Thermal Resistance
(Junction to Ambient)
Test conditions follow
standard test methods and
procedures for measuring
thermal impedance, per
EIA/JESD51.
24.63
16.3
15.2
°
C/W
Θ
JC
Thermal Resistance
(Junction to Case)
2.28
2.1
1.7
°
C/W
Note
15.Tested initially and after any design or process change that may affect these parameters.
AC Test Loads and Waveforms
OUTPUT
R = 1667
R = 1583
5 pF
INCLUDING
JIG AND
SCOPE
(a)
(b)
OUTPUT
R
L
= 50
Z
0
= 50
V
L
= 1.25V
2.5V
ALL INPUT PULSES
V
DDQ
GND
90%
10%
90%
10%
1 ns
1 ns
(c)
OUTPUT
R = 14K
R =14K
5 pF
INCLUDING
JIG AND
SCOPE
(a)
(b)
OUTPUT
R
L
= 50
Z
0
= 50
V
L
= 0.9V
1.8V
ALL INPUT PULSES
V
DDQ
-0.2
0.2
90%
10%
90%
10%
1 ns
1 ns
(c)
2.5V I/O Test Load
1.8V I/O Test Load
[+] Feedback
相关PDF资料
PDF描述
CY7C1481V25-100AXI 72-Mbit (2M x 36/4M x 18/1M x 72) Flow-Through SRAM
CY7C1481V25-100BZC 72-Mbit (2M x 36/4M x 18/1M x 72) Flow-Through SRAM
CY7C1481V25-100BZI 72-Mbit (2M x 36/4M x 18/1M x 72) Flow-Through SRAM
CY7C1481V25-100BZXC 72-Mbit (2M x 36/4M x 18/1M x 72) Flow-Through SRAM
CY7C1481V25-100BZXI 72-Mbit (2M x 36/4M x 18/1M x 72) Flow-Through SRAM
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