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参数资料
| 型号： | DC798B |
| 厂商： | Linear Technology |
| 文件页数： | 27/42页 |
| 文件大小： | 0K |
| 描述： | BOARD DELTA SIGMA ADC LTC2480 |
| 软件下载： | QuikEval System |
| 设计资源： | DC798B Design File DC798B Schematic |
| 标准包装： | 1 |
| 系列： | QuikEval™ |
| ADC 的数量： | 1 |
| 位数： | 16 |
| 采样率（每秒）： | 7.5 |
| 数据接口： | MICROWIRE?，串行，SPI? |
| 已用 IC / 零件： | LTC2480 |
| 已供物品： | 板 |
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LTC2480
2480fd
applicaTions inForMaTion
OUTPUT DATA RATE (READINGS/SEC)
0
10
RESOLUTION
(BITS)
12
16
18
20
24
10
50
70
2480 F23
14
22
40
90 100
20 30
60
80
VIN(CM) = VREF(CM)
VCC = VREF = 5V
VIN = 0V
FO = EXT CLOCK
RES = LOG 2 (VREF/NOISERMS)
TA = 85°C
TA = 25°C
OUTPUT DATA RATE (READINGS/SEC)
0
10
RESOLUTION
(BITS)
12
16
18
22
10
50
70
2480 F24
14
20
40
90 100
20 30
60
80
TA = 85°C
TA = 25°C
VIN(CM) = VREF(CM)
VCC = VREF = 5V
FO = EXT CLOCK
RES = LOG 2 (VREF/INLMAX)
OUTPUT DATA RATE (READINGS/SEC)
0
–10
OFFSET
ERROR
(ppm
OF
V
REF
)
–5
5
10
20
10
50
70
2480 F25
0
15
40
90 100
20 30
60
80
VCC = 5V, VREF = 2.5V
VCC = VREF = 5V
VIN(CM) = VREF(CM)
VIN = 0V
FO = EXT CLOCK
TA = 25°C
Figure 23. Resolution (NoiseRMS ≤ 1LSB)
vs Output Data Rate and Temperature
Figure 24. Resolution (INLMAX ≤ 1LSB)
vs Output Data Rate and Temperature
Figure 25. Offset Error vs Output
Data Rate and Reference Voltage
Figure 26. Resolution (NoiseRMS ≤ 1LSB)
vs Output Data Rate and Reference Voltage
Figure 27. Resolution (INLMAX ≤ 1LSB)
vs Output Data Rate and Reference Voltage
OUTPUT DATA RATE (READINGS/SEC)
0
10
RESOLUTION
(BITS)
12
16
18
20
24
10
50
70
2480 F26
14
22
40
90 100
20 30
60
80
VIN(CM) = VREF(CM)
VIN = 0V
FO = EXT CLOCK
TA = 25°C
RES = LOG 2 (VREF/NOISERMS)
VCC = 5V, VREF = 2.5V
VCC = VREF = 5V
OUTPUT DATA RATE (READINGS/SEC)
0
10
RESOLUTION
(BITS)
12
16
18
22
10
50
70
2480 F27
14
20
40
90 100
20 30
60
80
VCC = 5V, VREF = 2.5V
VCC = VREF = 5V
VIN(CM) = VREF(CM)
VIN = 0V
REF– = GND
FO = EXT CLOCK
TA = 25°C
RES = LOG 2 (VREF/INLMAX)
quency.Inmanyapplications,thesubsequentperformance
degradation can be substantially reduced by relying upon
theLTC2480’sexceptionalcommonmoderejectionandby
carefully eliminating common mode to differential mode
conversion sources in the input circuit. The user should
avoid single-ended input filters and should maintain a
very high degree of matching and symmetry in the circuits
driving the IN+ and IN– pins.
Second, the increase in clock frequency will increase
proportionally the amount of sampling charge transferred
through the input and the reference pins. If large external
input and/or reference capacitors (CIN, CREF) are used, the
previoussectionprovidesformulaeforevaluatingtheeffect
ofthesourceresistanceupontheconverterperformancefor
any value of fEOSC. If small external input and/or reference
capacitors (CIN, CREF) are used, the effect of the external
source resistance upon the LTC2480 typical performance
can be inferred from Figures 13, 14, 15 and 16 in which
the horizontal axis is scaled by 307200/fEOSC.
Third,anincreaseinthefrequencyoftheexternaloscillator
above 1MHz (a more than 3
× increase in the output data
rate) will start to decrease the effectiveness of the internal
autocalibration circuits. This will result in a progressive
degradationintheconverteraccuracyandlinearity.Typical
measured performance curves for output data rates up to
100 readings per second are shown in Figures 20 to 27. In
order to obtain the highest possible level of accuracy from
this converter at output data rates above 20 readings per
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