参数资料
型号: DS1265AB-70IND
厂商: Maxim Integrated
文件页数: 6/8页
文件大小: 0K
描述: IC NVSRAM 8MBIT 70NS 36DIP
标准包装: 9
格式 - 存储器: RAM
存储器类型: NVSRAM(非易失 SRAM)
存储容量: 8M(1M x 8)
速度: 70ns
接口: 并联
电源电压: 4.75 V ~ 5.25 V
工作温度: -40°C ~ 85°C
封装/外壳: 36-DIP 模块(0.600",15.24mm)
供应商设备封装: 36-EDIP
包装: 管件
DS1265Y/AB
POWER-DOWN/POWER-UP CONDITION
SEE NOTE 11
POWER-DOWN/POWER-UP TIMING
(T A : See Note 10)
PARAMETER
V CC Fail Detect to CE and WE Inactive
SYMBOL
t PD
MIN
TYP
MAX
1.5
UNITS
μ s
NOTES
11
V CC slew from V TP to 0V
V CC slew from 0V to V TP
V CC Valid to CE and WE Inactive
V CC Valid to End of Write Protection
t F
t R
t PU
t REC
150
150
2
125
μ s
μ s
ms
ms
(T A = +25 ° C)
PARAMETER
Expected Data Retention Time
SYMBOL
t DR
MIN
10
TYP
MAX
UNITS
years
NOTES
9
WARNING:
Under no circumstance are negative undershoots, of any amplitude, allowed when device is in battery
backup mode.
NOTES:
1. WE is high for a Read Cycle.
2. OE = V IH or V IL . If OE = V IH during write cycle, the output buffers remain in a high-impedance state.
3. t WP is specified as the logical AND of CE or WE . t WP is measured from the latter of CE or WE going
low to the earlier of CE or WE going high.
4. t DS is measured from the earlier of CE or WE going high.
5. These parameters are sampled with a 5 pF load and are not 100% tested.
6. If the CE low transition occurs simultaneously with or latter than the WE low transition, the output
buffers remain in a high-impedance state during this period.
7. If the CE high transition occurs prior to or simultaneously with the WE high transition, the output
buffers remain in high-impedance state during this period.
6 of 8
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