参数资料
型号: DS21FT44N+
厂商: Maxim Integrated Products
文件页数: 101/117页
文件大小: 0K
描述: IC FRAMER 4X4 16CH 300-BGA
产品培训模块: Lead (SnPb) Finish for COTS
Obsolescence Mitigation Program
标准包装: 40
控制器类型: E1 调帧器
接口: 并行/串行
电源电压: 2.97 V ~ 3.63 V
电流 - 电源: 225mA
工作温度: -40°C ~ 85°C
安装类型: 表面贴装
封装/外壳: 300-BBGA
供应商设备封装: 300-PBGA(27x27)
包装: 管件
DS21FT44/DS21FF44
84 of 117
21.
JTAG-BOUNDARY SCAN ARCHITECTURE AND TEST ACCESS PORT
21.1. DESCRIPTION
The DS21Q44 IEEE 1149.1 design supports the standard instruction codes SAMPLE/PRELOAD,
BYPASS, and EXTEST. Optional public instructions included with this design are HIGHZ, CLAMP, and
IDCODE. See Figure 21-1 for a block diagram. The DS21Q44 contains the following items which meet
the requirements set by the IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture.
The DS21FT42 should be considered as 3 individual DS21Q42 devices. The DS21FF44 should be
considered as 4 individual DS21Q44 devices.
Test Access Port (TAP)
TAP Controller
Instruction Register
Bypass Register
Boundary Scan Register
Device Identification Register
The JTAG feature is only available when the DS21Q44 feature set is selected (FMS = 0). The JTAG
feature is disabled when the DS21Q44 is configured for emulation of the DS21Q43 (FMS = 1). FMS is
connected to ground for the DS21FF44/DS21FT44.
Details on Boundary Scan Architecture and the Test Access Port can be found in IEEE 1149.1-1990,
IEEE 1149.1a-1993, and IEEE 1149.1b-1994.
The Test Access Port has the necessary interface pins; JTRST*, JTCLK, JTMS, JTDI, and JTDO. See
the pin descriptions for details.
Figure 21-1. BOUNDARY SCAN ARCHITECTURE
+V
Boundary Scan
Register
Identification
Register
Bypass
Register
Instruction
Register
JTDI
JTMS
JTCLK
JTRST
JTDO
+V
Test Access Port
Controller
MUX
10K
Select
Output Enable
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