参数资料
型号: DS26502LN+
厂商: Maxim Integrated Products
文件页数: 6/125页
文件大小: 0K
描述: IC T1/E1/J1 64KCC ELEMENT 64LQFP
产品培训模块: Lead (SnPb) Finish for COTS
Obsolescence Mitigation Program
标准包装: 160
类型: BITS 元件,多路复用器
PLL:
主要目的: T1/E1
输入: 时钟
输出: 时钟
电路数: 1
比率 - 输入:输出: 2:3
差分 - 输入:输出: 无/无
频率 - 最大: 6.312MHz
电源电压: 3.135 V ~ 3.465 V
工作温度: -40°C ~ 85°C
安装类型: 表面贴装
封装/外壳: 64-LQFP
供应商设备封装: 64-LQFP(10x10)
包装: 托盘
产品目录页面: 1430 (CN2011-ZH PDF)
DS26502 T1/E1/J1/64KCC BITS Element
103 of 125
17.1 Instruction Register
The instruction register contains a shift register as well as a latched parallel output and is 3 bits in length.
When the TAP controller enters the shift-IR state, the instruction shift register will be connected between
JTDI and JTDO. While in the shift-IR state, a rising edge on JTCLK with JTMS LOW will shift the data
one stage toward the serial output at JTDO. A rising edge on JTCLK in the exit1-IR state or the exit2-IR
state with JTMS HIGH will move the controller to the update-IR state. The falling edge of that same
JTCLK will latch the data in the instruction shift register to the instruction parallel output.
Table 17-1. Instruction Codes for IEEE 1149.1 Architecture
INSTRUCTION
SELECTED REGISTER
INSTRUCTION CODES
SAMPLE/PRELOAD
Boundary Scan
010
BYPASS
Bypass
111
EXTEST
Boundary Scan
000
CLAMP
Bypass
011
HIGHZ
Bypass
100
IDCODE
Device Identification
001
SAMPLE/PRELOAD
This is a mandatory instruction for the IEEE 1149.1 specification that supports two functions. The digital
I/Os of the device can be sampled at the boundary scan register without interfering with the normal
operation of the device by using the capture-DR state. SAMPLE/PRELOAD also allows the device to
shift data into the boundary scan register via JTDI using the shift-DR state.
BYPASS
When the BYPASS instruction is latched into the parallel instruction register, JTDI connects to JTDO
through the one-bit bypass test register. This allows data to pass from JTDI to JTDO not affecting the
device’s normal operation.
EXTEST
This allows testing of all interconnections to the device. When the EXTEST instruction is latched in the
instruction register, the following actions occur. Once enabled via the Update-IR state, the parallel
outputs of all digital output pins will be driven. The boundary scan register will be connected between
JTDI and JTDO. The Capture-DR will sample all digital inputs into the boundary scan register.
CLAMP
All digital outputs of the device will output data from the boundary scan parallel output while connecting
the bypass register between JTDI and JTDO. The outputs will not change during the CLAMP instruction.
HIGHZ
All digital outputs of the device will be placed in a high-impedance state. The BYPASS register will be
connected between JTDI and JTDO.
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