参数资料
型号: DS3153+
厂商: Maxim Integrated Products
文件页数: 6/61页
文件大小: 0K
描述: IC LIU DS3/E3/STS-1 144-CSBGA
产品培训模块: Lead (SnPb) Finish for COTS
Obsolescence Mitigation Program
标准包装: 160
类型: 线路接口装置(LIU)
驱动器/接收器数: 2/2
规程: DS3
电源电压: 3.135 V ~ 3.465 V
安装类型: 表面贴装
封装/外壳: 144-BGA,CSPBGA
供应商设备封装: 144-TECSBGA(13x13)
包装: 托盘
DS3151/DS3152/DS3153/DS3154 Single/Dual/Triple/Quad DS3/E3/STS-1 LIUs
14 of 61
NAME
I/O
FUNCTION
transaction, with R/
W = 1 indicating a read and R/W = 0 indicating a write.
RD/DS
I
Read Enable (Active Low) or Data Strobe (Active Low). In Intel bus mode (MOT = 0),
RD is asserted
to read internal registers. In Motorola bus mode (MOT = 1), the rising edge of
DS writes data to
internal registers.
A[5:0]
I
Address Bus. These inputs specify the address of the internal register to be accessed. A5 is not
present on the DS3152. A5 and A4 are not present on the DS3151.
D[7:0]
I/O
Data Bus. These bidirectional lines are inputs during writes to internal registers. They are outputs
during reads from internal registers.
INT
O
Interrupt Output (Active Low, Open Drain). This pin is forced low in response to one or more
unmasked, active interrupt sources within the device.
INT remains low until the interrupt is serviced or
masked.
VDD
P
Positive Supply. 3.3V
±5%. All V
DD signals should be wired together.
VSS
P
Ground Reference. All VSS signals should be wired together.
Table 4-E. JTAG and Test Pin Descriptions
NAME
I/O
FUNCTION
JTCLK
I
JTAG IEEE 1149.1 Test Serial Clock. JTCLK shifts data into JTDI on the rising edge and out of
JTDO on the falling edge. If boundary scan is not used, JTCLK should be pulled high.
JTDI
IPU
JTAG IEEE 1149.1 Test Serial-Data Input (Internal 10k
Ω Pullup). Test instructions and data are
clocked in on this pin on the rising edge of JTCLK. If boundary scan is not used, JTDI should be left
unconnected or pulled high.
JTDO
O
JTAG IEEE 1149.1 Test Serial-Data Output. Test instructions and data are clocked out on this pin on
the falling edge of JTCLK.
JTRST
IPU
JTAG IEEE 1149.1 Test Reset (Internal 10k
Ω Pullup). This pin is used to asynchronously reset the
test access port (TAP) controller. If boundary scan is not used,
JTRST can be held low or high.
JTMS
IPU
JTAG IEEE 1149.1 Test Mode Select (Internal 10k
Ω Pullup). This pin is sampled on the rising edge
of JTCLK and is used to place the port into the various defined IEEE 1149.1 states. If boundary scan
is not used, JTMS should be left unconnected or pulled high.
TEST
IPU
Factory Test Pin. Leave unconnected or wire high for normal operation.
Note 1: Pin type I = input pin. Pin type O = output pin. Pin type P = power-supply pin.
Note 2: Pin type O3 is an output that can be tri-stated.
Note 3: Pin type IPU is an input with an internal 10kΩ pullup.
Note 4: For pin names of the form PINn, n = LIU# = 1, 2, 3, or 4. PIN1 is on LIU 1, PIN2 is on LIU 2, etc.
Note 5: Section 14 shows hardware mode and CPU bus mode pin assignments.
Table 4-F. Transmitter Data Select Options
TDSA
TDSB
E3M
STS
Tx MODE
TRANSMIT DATA SELECTED
0
X
Any
Normal data as input at TPOS and TNEG
0
1
0
DS3
0
1
0
E3
0
1
STS-1
Unframed all ones
0
1
0
1
DS3
DS3 AIS per ANSI T1.107 (Figure 7-2)
1
0
X
Any
Unframed 100100… pattern
1
0
E3
2
23 - 1 PRBS pattern per ITU O.151
1
0
X
DS3
1
STS-1
2
15 - 1 PRBS pattern per ITU O.151
Note 1: This coding of the TDSA, TDSB, E3M, and STS bits allows AIS generation to be enabled by holding TDSA = 0 and changing TDSB
from 0 to 1. The type of DS3 AIS signal is selected by the STS bit with E3M = 0.
Note 2: If E3M and/or STS are changed when {TDSA,TDSB}
≠ 00, TDSA and TDSB must both be cleared to 0. After they are cleared, TDSA
and TDSB can be configured to transmit a pattern in the new operating mode.
Table 4-G. Receiver PRBS Pattern Select Options
E3M
STS
Rx MODE
RECEIVER PRBS PATTERN SELECTED
1
0
E3
2
23 - 1 PRBS pattern per ITU O.151
0
X
DS3
1
STS-1
2
15 - 1 PRBS pattern per ITU O.151
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