参数资料
型号: EM260-RTY
厂商: Silicon Laboratories Inc
文件页数: 37/50页
文件大小: 0K
描述: IC ZIGBEE SYSTEM-ON-CHIP 40-QFN
标准包装: 429
频率: 2.4GHz
数据传输率 - 最大: 250kbps
调制或协议: 802.15.4
应用: ZigBee?
功率 - 输出: -32dBm ~ 3dBm
灵敏度: -97dBm
电源电压: 2.1 V ~ 3.6 V
电流 - 接收: 30mA
电流 - 传输: 34mA
数据接口: PCB,表面贴装
天线连接器: PCB,表面贴装
工作温度: -40°C ~ 85°C
封装/外壳: 40-VFQFN 裸露焊盘
包装: 托盘
其它名称: 636-1003
EM260
7 SIF Module Programming and Debug Interface
SIF is a synchronous serial interface developed by Cambridge Consultants Ltd. It is the primary programming
and debug interface of the EM260. The SIF module allows external devices to read and write memory-mapped
registers in real-time without changing the functionality or timing of the XAP2b core. See document AN696,
PCB Design with an EM260, for the PCB-level design details regarding the implementation of the SIF interface.
The EM260 pins involved in the SIF Interface:
nSIF_LOAD
SIF_CLK
SIF_MOSI
SIF_MISO
?
nRESET
In addition, the VDD_PADS and Ground Net are required for external voltage translation and buffering of the
SIF Signals.
The SIF interface provides the following:
PCB production test interface via Virtual UART and a Debug Adapter (ISA)
Programming and debug interface during EmberZNet application development
In order to achieve the deep sleep currents specified in Table 5, a pull-down resistor must be connected to
the SIF_MOSI pin. In addition, Silicon Labs recommends a pull-up resistor to be placed on the nSIF_LOAD pin in
order to prevent noise from coupling onto the signal. Both of these recommendations are documented within
the EM260 Reference designs.
When developing application-specific manufacturing test procedures, Silicon Labs recommends the designer
refer to document AN700, Manufacturing Test Guidelines . This document provides more detail regarding
importance of designing the proper SIF interface as well as timing of the SIF.
Page 37
120-0260-000M Rev 1.1
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