参数资料
型号: EP4SE530H35C3
厂商: Altera
文件页数: 72/82页
文件大小: 0K
描述: IC STRATIX IV FPGA 530K 1152HBGA
产品培训模块: Three Reasons to Use FPGA's in Industrial Designs
标准包装: 3
系列: STRATIX® IV E
LAB/CLB数: 21248
逻辑元件/单元数: 531200
RAM 位总计: 28033024
输入/输出数: 744
电源电压: 0.87 V ~ 0.93 V
安装类型: 表面贴装
工作温度: 0°C ~ 85°C
封装/外壳: 1152-BBGA 裸露焊盘
供应商设备封装: 1152-HBGA(40x40)
1–66
Chapter 1: DC and Switching Characteristics for Stratix IV Devices
Glossary
Stratix IV Device Handbook
March 2014
Altera Corporation
Volume 4: Device Datasheet and Addendum
S
SW (sampling
window)
Timing Diagram—the period of time during which the data must be valid in order to capture
it correctly. The setup and hold times determine the ideal strobe position within the sampling
window, as shown:
Single-ended
voltage
referenced I/O
standard
The JEDEC standard for SSTl and HSTL I/O defines both the AC and DC input signal values.
The AC values indicate the voltage levels at which the receiver must meet its timing
specifications. The DC values indicate the voltage levels at which the final logic state of the
receiver is unambiguously defined. After the receiver input has crossed the AC value, the
receiver changes to the new logic state.
The new logic state is then maintained as long as the input stays beyond the AC threshold.
This approach is intended to provide predictable receiver timing in the presence of input
waveform ringing, as shown:
Single-Ended Voltage Referenced I/O Standard
T
tC
High-speed receiver/transmitter input and output clock period.
TCCS (channel-
to-channel-skew)
The timing difference between the fastest and slowest output edges, including tCO variation
and clock skew, across channels driven by the same PLL. The clock is included in the TCCS
measurement (refer to the Timing Diagram figure under SW in this table).
tDUTY
High-speed I/O block: Duty cycle on high-speed transmitter output clock.
Timing Unit Interval (TUI)
The timing budget allowed for skew, propagation delays, and data sampling window.
(TUI = 1/(Receiver Input Clock Frequency Multiplication Factor) = tC/w)
tFALL
Signal high-to-low transition time (80-20%)
tINCCJ
Cycle-to-cycle jitter tolerance on the PLL clock input
tOUTPJ_IO
Period jitter on the general purpose I/O driven by a PLL
tOUTPJ_DC
Period jitter on the dedicated clock output driven by a PLL
tRISE
Signal low-to-high transition time (20-80%)
U
——
Table 1–54. Glossary Table (Part 3 of 4)
Letter
Subject
Definitions
Bit Time
0.5 x TCCS
RSKM
Sampling Window
(SW)
RSKM
0.5 x TCCS
VIH(AC)
VIH(DC)
VREF
VIL(DC)
VIL(AC)
VOH
VOL
VCCIO
VSS
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EP4SE530H35C3ES 功能描述:IC STRATIX IV E 530K 1152-HBGA RoHS:否 类别:集成电路 (IC) >> 嵌入式 - FPGA(现场可编程门阵列) 系列:STRATIX® IV E 产品变化通告:XC4000(E,L) Discontinuation 01/April/2002 标准包装:24 系列:XC4000E/X LAB/CLB数:100 逻辑元件/单元数:238 RAM 位总计:3200 输入/输出数:80 门数:3000 电源电压:4.5 V ~ 5.5 V 安装类型:表面贴装 工作温度:-40°C ~ 100°C 封装/外壳:120-BCBGA 供应商设备封装:120-CPGA(34.55x34.55)
EP4SE530H35C3N 功能描述:FPGA - 现场可编程门阵列 FPGA - Stratix IV E 21248 LABs 744 IOs RoHS:否 制造商:Altera Corporation 系列:Cyclone V E 栅极数量: 逻辑块数量:943 内嵌式块RAM - EBR:1956 kbit 输入/输出端数量:128 最大工作频率:800 MHz 工作电源电压:1.1 V 最大工作温度:+ 70 C 安装风格:SMD/SMT 封装 / 箱体:FBGA-256
EP4SE530H35C3NES 功能描述:IC STRATIX IV E 530K 1152-HBGA RoHS:是 类别:集成电路 (IC) >> 嵌入式 - FPGA(现场可编程门阵列) 系列:STRATIX® IV E 产品变化通告:XC4000(E,L) Discontinuation 01/April/2002 标准包装:24 系列:XC4000E/X LAB/CLB数:100 逻辑元件/单元数:238 RAM 位总计:3200 输入/输出数:80 门数:3000 电源电压:4.5 V ~ 5.5 V 安装类型:表面贴装 工作温度:-40°C ~ 100°C 封装/外壳:120-BCBGA 供应商设备封装:120-CPGA(34.55x34.55)
EP4SE530H35C4 功能描述:FPGA - 现场可编程门阵列 FPGA - Stratix IV E 21248 LABs 744 IOs RoHS:否 制造商:Altera Corporation 系列:Cyclone V E 栅极数量: 逻辑块数量:943 内嵌式块RAM - EBR:1956 kbit 输入/输出端数量:128 最大工作频率:800 MHz 工作电源电压:1.1 V 最大工作温度:+ 70 C 安装风格:SMD/SMT 封装 / 箱体:FBGA-256
EP4SE530H35C4ES 制造商:Altera Corporation 功能描述:IC STRATIX IV E FPGA 1152HBGA 制造商:Altera Corporation 功能描述:IC FPGA 744 I/O 1152HBGA