参数资料
型号: FDD2572
厂商: Fairchild Semiconductor
文件页数: 1/11页
文件大小: 0K
描述: MOSFET N-CH 150V 29A D-PAK
产品培训模块: High Voltage Switches for Power Processing
产品目录绘图: DPAK, TO-252(AA)
标准包装: 1
系列: PowerTrench®
FET 型: MOSFET N 通道,金属氧化物
FET 特点: 标准
漏极至源极电压(Vdss): 150V
电流 - 连续漏极(Id) @ 25° C: 29A
开态Rds(最大)@ Id, Vgs @ 25° C: 54 毫欧 @ 9A,10V
Id 时的 Vgs(th)(最大): 4V @ 250µA
闸电荷(Qg) @ Vgs: 34nC @ 10V
输入电容 (Ciss) @ Vds: 1770pF @ 25V
功率 - 最大: 135W
安装类型: 表面贴装
封装/外壳: TO-252-3,DPak(2 引线+接片),SC-63
供应商设备封装: D-Pak
包装: 标准包装
产品目录页面: 1606 (CN2011-ZH PDF)
其它名称: FDD2572DKR
September 2002
FDD2572 / FDU2572
N-Channel PowerTrench ? MOSFET
150V, 29A, 54m ?
Features
? r DS(ON) = 45m ? (Typ.), V GS = 10V, I D = 9A
? Q g (tot) = 26nC (Typ.), V GS = 10V
? Low Miller Charge
? Low Q RR Body Diode
? UIS Capability (Single Pulse and Repetitive Pulse)
? Qualified to AEC Q101
Formerly developmental type 82860
Applications
? DC/DC converters and Off-Line UPS
? Distributed Power Architectures and VRMs
? Primary Switch for 24V and 48V Systems
? High Voltage Synchronous Rectifier
? Direct Injection / Diesel Injection Systems
? 42V Automotive Load Control
? Electronic Valve Train Systems
GATE
SOURCE
TO-252AA
FDD SERIES
DRAIN
(FLANGE)
DRAIN
(FLANGE)
SOURCE
DRAIN
GATE
TO-251AA
FDU SERIES
G
D
S
MOSFET Maximum Ratings T C = 25°C unless otherwise noted
Symbol
V DSS
V GS
Drain to Source Voltage
Gate to Source Voltage
Parameter
Ratings
150
± 20
Units
V
V
Drain Current
Continuous (T C = 25 o C, V GS = 10V)
29
A
Continuous (T C = 100 C, V GS = 10V)
C
I D
E AS
P D
T J , T STG
o
Continuous (T amb = 25 o C, V GS = 10V, R θ JA = 52 o C/W)
Pulsed
Single Pulse Avalanche Energy (Note 1)
Power dissipation
Derate above 25 o C
Operating and Storage Temperature
20
4
Figure 4
36
135
0.9
-55 to 175
A
A
mJ
W
W/ o C
o
Thermal Characteristics
R θ JC
R θ JA
Thermal Resistance Junction to Case TO-251, TO-252
Thermal Resistance Junction to Ambient TO-251, TO-252
1.11
100
o
o
C/W
C/W
R θ JA
Thermal Resistance Junction to Ambient TO-252, 1in 2 copper pad area
52
o C/W
This product has been designed to meet the extreme test conditions and environment demanded by the automotive industry. For a
copy of the requirements, see AEC Q101 at: http://www.aecouncil.com/
Reliability data can be found at: http://www.fairchildsemi.com/products/discrete/reliability/index.html.
All Fairchild Semiconductor products are manufactured, assembled and tested under ISO9000 and QS9000 quality systems
certification.
?2002 Fairchild Semiconductor Corporation
FDD2572 / FDU2572 Rev. B
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