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参数资料
| 型号： | FQP8P10 |
| 厂商： | Fairchild Semiconductor |
| 文件页数： | 2/8页 |
| 文件大小： | 0K |
| 描述： | MOSFET P-CH 100V 8A TO-220 |
| 产品培训模块： | High Voltage Switches for Power Processing |
| 标准包装： | 50 |
| 系列： | QFET™ |
| FET 型： | MOSFET P 通道，金属氧化物 |
| FET 特点： | 标准 |
| 漏极至源极电压(Vdss)： | 100V |
| 电流 - 连续漏极(Id) @ 25° C： | 8A |
| 开态Rds（最大）@ Id, Vgs @ 25° C： | 530 毫欧 @ 4A，10V |
| Id 时的 Vgs(th)（最大）： | 4V @ 250µA |
| 闸电荷(Qg) @ Vgs： | 15nC @ 10V |
| 输入电容 (Ciss) @ Vds： | 470pF @ 25V |
| 功率 - 最大： | 65W |
| 安装类型： | 通孔 |
| 封装/外壳： | TO-220-3 |
| 供应商设备封装： | TO-220 |
| 包装： | 管件 |
| 其它名称： | FQP8P10-ND FQP8P10FS |
Electrical Characteristics
T C = 25°C unless otherwise noted
Symbol
Parameter
Test Conditions
Min
Typ
Max
Unit
Off Characteristics
BV DSS
? BV DSS
/ ? T J
I DSS
I GSSF
I GSSR
Drain-Source Breakdown Voltage
Breakdown Voltage Temperature
Coefficient
Zero Gate Voltage Drain Current
Gate-Body Leakage Current, Forward
Gate-Body Leakage Current, Reverse
V GS = 0 V, I D = -250 μ A
I D = -250 μ A, Referenced to 25°C
V DS = -100 V, V GS = 0 V
V DS = -80 V, T C = 150°C
V GS = -30 V, V DS = 0 V
V GS = 30 V, V DS = 0 V
-100
--
--
--
--
--
--
-0.1
--
--
--
--
--
--
-1
-10
-100
100
V
V/°C
μ A
μ A
nA
nA
On Characteristics
V GS(th)
R DS(on)
Gate Threshold Voltage
Static Drain-Source
On-Resistance
V DS = V GS , I D = -250 μ A
V GS = -10 V, I D = -4.0 A
-2.0
--
--
0.41
-4.0
0.53
V
?
g FS
Forward Transconductance
V DS = -40 V, I D = -4.0 A
(Note 4)
--
4.3
--
S
Dynamic Characteristics
C iss
C oss
C rss
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
V DS = -25 V, V GS = 0 V,
f = 1.0 MHz
--
--
--
360
120
30
470
155
40
pF
pF
pF
Switching Characteristics
t d(on)
t r
t d(off)
t f
Q g
Q gs
Q gd
Turn-On Delay Time
Turn-On Rise Time
Turn-Off Delay Time
Turn-Off Fall Time
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
V DD = -50 V, I D = -8.0 A,
R G = 25 ?
V DS = -80 V, I D = -8.0 A,
V GS = -10 V
(Note 4, 5)
(Note 4, 5)
--
--
--
--
--
--
--
11
110
20
35
12
3.0
6.4
30
230
50
80
15
--
--
ns
ns
ns
ns
nC
nC
nC
Drain-Source Diode Characteristics and Maximum Ratings
I S
I SM
Maximum Continuous Drain-Source Diode Forward Current
Maximum Pulsed Drain-Source Diode Forward Current
--
--
--
--
-8.0
-32
A
A
V SD
t rr
Drain-Source Diode Forward Voltage
Reverse Recovery Time
V GS = 0 V, I S = -8.0 A
V GS = 0 V, I S = -8.0 A,
--
--
--
98
-4.0
--
V
ns
Q rr
Reverse Recovery Charge
dI F / dt = 100 A/ μ s
(Note 4)
--
0.35
--
μ C
Notes:
1. Repetitive Rating : Pulse width limited by maximum junction temperature
2. L = 3.5mH, I AS = -8.0A, V DD = -25V, R G = 25 ?, Starting T J = 25°C
3. I SD ≤ -8.0A, di/dt ≤ 300A/ μ s, V DD ≤ BV DSS, Starting T J = 25°C
4. Pulse Test : Pulse width ≤ 300 μ s, Duty cycle ≤ 2%
5. Essentially independent of operating temperature
?20 0 2 Fairchild Semiconductor Corporation
FQP 8P10 Rev. C0
www.fairchildsemi.com
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