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参数资料
| 型号： | GSC24BC16 |
| 厂商： | GTM CORPORATION |
| 英文描述： | 2-WIRE SERIAL EEPROMS |
| 中文描述： | 2线串行EEPROM |
| 文件页数： | 1/9页 |
| 文件大小： | 305K |
| 代理商： | GSC24BC16 |
GSC24BC01/02/02/04/08/16
Page: 1/9
ISSUED DATE :2006/06/14
REVISED DATE :
G
G S
S C
C 2244B
B C
C 0011//0022//0044//0088//1166
2 - w i r e S e r i a l E E P R O M s 1 K / 2 K / 4 K / 8 K / 1 6 K
Description
The GSC24BC family provides 1K, 2K, 4K, 8K and 16K of serial electrically erasable and programmable
read-only memory (EEPROM). The wide Vdd range allows for low-voltage operation down to 1.8V. The device,
fabricated using traditional CMOS EEPROM technology, is optimized for many industrial and commercial
applications where low-voltage and low-power operation is essential. The device is accessed via a 2-wire serial
interface.
Features
&Internally organized as 128x8 (1K), 256x8 (2K)
512x8 (4K), 1024x8 (8K), 2048x8 (16K),
&Low-voltage and standard-voltage operation:
1.8V~5.5V
& -wire serial interface bus
&Date retention: 100years
&High endurance: 1,000,000 Write Cycles
100KHz (1.8V) & 400KHz (5V) compatibility
&Bi-directional data transfer protocol
&Self-timed write cycle (5ms max)
&Write protect pin for hardware data protection
&8-byte page (1K, 2K) and 16-byte page (4K,8K,16K)
write modes
&Allows for partial page write
Package Dimensions
Millimeter
REF.
Min.
Max.
REF.
Min.
Max.
A
5.80
6.20
M
0.10
0.25
B
4.80
5.00
H
0.35
0.49
C
3.80
4.00
L
1.35
1.75
D
0°
8°
J
0.375 REF.
E
0.40
0.90
K
45°
F
0.19
0.25
G
1.27 TYP.
Figure 1. Pin Configurations
Pin Name
Function
A0 – A2
Address inputs
SDA
Serial Data
SCL
Serial Clock Input
WP
Write Protect
Gnd
Ground
Vcc
Power Supply
Absolute Maximum Ratings
Parameter
Ratings
Unit
Voltage on Any Pin with Respect to Ground
-0.8 to Vcc +1.5
V
Maximum Operating Voltage
6.25
V
DC Output Current
5.0
mA
Operating Temperature Range
-55 ~ +125
:
Storage Temperature Range
-65 ~ +150
:
Note: Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of
these specifications are not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
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