参数资料
型号: HGTP5N120BND_NL
厂商: FAIRCHILD SEMICONDUCTOR CORP
元件分类: IGBT 晶体管
英文描述: 21A, 1200V, NPT Series N-Channel IGBTs with Anti-Parallel Hyperfast Diodes
中文描述: 21 A, 1200 V, N-CHANNEL IGBT, TO-220AB
封装: TO-220AB ALTERNATE VERSION, 3 PIN
文件页数: 3/8页
文件大小: 216K
代理商: HGTP5N120BND_NL
2003 Fairchild Semiconductor Corporation
HGTG5N120BND, HGTP5N120BND, Rev. B1
Current Turn-On Delay Time
td(ON)I
IGBT and Diode at TJ = 150
oC,
ICE = 5A,
VCE = 960V,
VGE = 15V,
RG = 25,
L = 5mH,
Test Circuit (Figure 20)
-20
25
ns
Current Rise Time
trI
-15
20
ns
Current Turn-Off Delay Time
td(OFF)I
-
182
280
ns
Current Fall Time
tfI
-
175
200
ns
Turn-On Energy
EON
-
1000
1300
J
Turn-Off Energy (Note 3)
EOFF
-
560
800
J
Diode Forward Voltage
VEC
IEC = 10A
-
2.70
3.50
V
Diode Reverse Recovery Time
trr
IEC = 7A, dlEC/dt = 200A/s
-
50
65
ns
IEC = 1A, dlEC/dt = 200A/s
-
30
40
ns
Thermal Resistance Junction To Case
RθJC
IGBT
-
0.75
oC/W
Diode
-
1.75
oC/W
NOTE:
3. Turn-Off Energy Loss (EOFF) is defined as the integral of the instantaneous power loss starting at the trailing edge of the input pulse and
ending at the point where the collector current equals zero (ICE = 0A). All devices were tested per JEDEC Standard No. 24-1 Method for
Measurement of Power Device Turn-Off Switching Loss. This test method produces the true total Turn-Off Energy Loss.
Electrical Specifications
TC = 25
oC, Unless Otherwise Specified (Continued)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNITS
Typical Performance Curves Unless Otherwise Specified
FIGURE 1. DC COLLECTOR CURRENT vs CASE
TEMPERATURE
FIGURE 2. MINIMUM SWITCHING SAFE OPERATING AREA
TC, CASE TEMPERATURE (
oC)
I CE
,DC
COL
L
E
CT
OR
CURRENT
(
A
)
50
0
25
75
100
125
150
5
10
15
25
20
VGE = 15V
VCE, COLLECTOR TO EMITTER VOLTAGE (V)
1400
0
I CE
,C
O
L
ECT
O
R
T
O
EM
IT
T
E
R
CURRENT
(
A
)
600
800
400
200
1000
1200
0
TJ = 150
oC, R
G = 25, VGE = 15V, L = 5mH
5
10
15
20
25
30
35
HGTG5N120BND, HGTP5N120BND
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