参数资料
型号: HI5812KIB
厂商: Intersil
文件页数: 10/16页
文件大小: 0K
描述: ADC 12BIT 50KSPS 1LSB 24-SOIC
标准包装: 30
位数: 12
采样率(每秒): 50k
数据接口: 并联
转换器数目: 1
功率耗散(最大): 25mW
电压电源: 模拟和数字
工作温度: -40°C ~ 85°C
安装类型: 表面贴装
封装/外壳: 24-SOIC(0.295",7.50mm 宽)
供应商设备封装: 24-SOIC
包装: 管件
输入数目和类型: 1 个单端,单极
3
Absolute Maximum Ratings
Thermal Information
Supply Voltage
VDD to VSS . . . . . . . . . . . . . . . . . . . . (VSS -0.5V) < VDD < +6.5V
VAA+ to VAA- . . . . . . . . . . . . . . . . . . . (VSS -0.5V) to (VSS +6.5V)
VAA+ to VDD . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±0.3V
Analog and Reference Inputs
VIN, VREF+, VREF- . . . . . . . . (VSS -0.3V) < VINA < (VDD +0.3V)
Digital I/O Pins . . . . . . . . . . . . . . . (VSS -0.3V) < VI/O < (VDD +0.3V)
Operating Conditions
Temperature Range. . . . . . . . . . . . . . . . . . . . . . . . . . -40oC to 85oC
Thermal Resistance (Typical, Note 1)
θJA (oC/W)
PDIP Package* . . . . . . . . . . . . . . . . . . . . . . . . . . . .
70
SOIC Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
75
Maximum Junction Temperature
Plastic Packages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 150oC
Maximum Storage Temperature Range . . . . . . . . . -65οC to 150oC
Maximum Lead Temperature (Soldering, 10s) . . . . . . . . . . . . 300oC
(SOIC - Lead Tips Only)
*Pb-free PDIPs can be used for through hole wave solder processing
only. They are not intended for use in Reflow solder processing
applications.
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1.
θJA is measured with the component mounted on a low effective thermal conductivity test board in free air. See Tech Brief TB379 for details.
Electrical Specifications
VDD = VAA+ = 5V, VREF+ = +4.608V, VSS = VAA- = VREF- = GND, CLK = External 750kHz,
Unless Otherwise Specified
PARAMETER
TEST CONDITIONS
25oC
-40oC TO 85oC
UNITS
MIN
TYP
MAX
MIN
MAX
ACCURACY
Resolution
12
-
12
-
Bits
Integral Linearity Error, INL
(End Point)
J
-
±1.5
-
±1.5
LSB
K
-
±1.0
-
±1.0
LSB
Differential Linearity Error, DNL
J
-
±2.0
-
±2.0
LSB
K
-
±1.0
-
±1.0
LSB
Gain Error, FSE
(Adjustable to Zero)
J
-
±3.0
-
±3.0
LSB
K
-
±2.5
-
±2.5
LSB
Offset Error, VOS
(Adjustable to Zero)
J
-
±2.0
-
±2.0
LSB
K
-
±1.0
-
±1.0
LSB
Power Supply Rejection, PSRR
Offset Error PSRR
Gain Error PSRR
VREF = 4V
VDD = VAA+ = 5V ±5%
-
±0.1
±0.5
-
±0.5
LSB
DYNAMIC CHARACTERISTICS
Signal to Noise Ratio, SINAD
RMS Signal
RMS Noise + Distortion
J
fS = Internal Clock, fIN = 1kHz
fS = 750kHz, fIN = 1kHz
-
68.8
69.2
-
dB
K
fS = Internal Clock, fIN = 1kHz
fS = 750kHz, fIN = 1kHz
-
71.0
71.5
-
dB
Signal to Noise Ratio, SNR
RMS Signal
RMS Noise
J
fS = Internal Clock, fIN = 1kHz
fS = 750kHz, fIN = 1kHz
-
70.5
71.1
-
dB
K
fS = Internal Clock, fIN = 1kHz
fS = 750kHz, fIN = 1kHz
-
71.5
72.1
-
dB
Total Harmonic Distortion, THD
J
fS = Internal Clock, fIN = 1kHz
fS = 750kHz, fIN = 1kHz
-
-73.9
-73.8
-
dBc
K
fS = Internal Clock, fIN = 1kHz
fS = 750kHz, fIN = 1kHz
-
-80.3
-79.0
-
dBc
HI5812
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