参数资料
型号: HK16083N9S-T
厂商: TAIYO YUDEN CO LTD
元件分类: 通用定值电感
英文描述: 1 ELEMENT, 0.0039 uH, FERRITE-CORE, GENERAL PURPOSE INDUCTOR, SMD
封装: CHIP, 1608
文件页数: 4/19页
文件大小: 1023K
代理商: HK16083N9S-T
FERRITE
PRODUCTS
5
253
Please read the "Notice for TAIYO YUDEN products" before using this catalog.
RELIABILITY DATA
4/4
Multilayer chip inductors and beads
Note on standard condition: "standard condition" referred to herein is dened as follows:
5 to 35
of temperature, 45 to 85% relative humidity, and 86 to 106kPa of air pressure.
When there are questions concerning measurement results:
In order to provide correlation data, the test shall be conducted under condition of 20
2
of temperature, 60 to 70% relative hu-
midity, and 86 to 106kPa of air pressure. Unless otherwise specied, all the tests are conducted under the "standard condition."
(Note 1)
measurement shall be made after 48
2 hrs of
recovery under the standard condition.
Item
Specied Value
Test Methods and Remarks
BK0603 BK1005 BK1608 BK2125
ARRAY
BKP0603 BKP1005 BKP1608 BKP2125 CK1608 CK2125 CKP2520 LK1005
LK1608
LK2125 HK0603 HK1005 HK1608 HK2125 HKQ0603S AQ105
BK2010 BK3216
14 Damp Heat
Steady state
Appearance No signicant abnormality.
Impedance change Within
30
No
mechanical
damage.
Inductance
change
Within 20
Q change
Within 30
No
mechanical
damage.
Inductance
change
Within
30
No mechani-
cal damage.
Inductance
change
Within
10
Q change
Within
30
No
mechanical
damage.
Inductance
change
Within
Q change
Within
No mechanical damage.
Inductance change Within
10
Q change Within
20
BBK Series
Temperature 40 2
Humidity 90 to 95 RH
Duration 500
24
0 hrs
Recovery 2 to 3 hrs of recovery under the
standard condition after the removal from test
chamber. See Note 1
LK CK CKP HK HKQ AQ Series
Temperature 40 2
LK CK CKPSeries
60 2
HK HKQ AQ Series
Humidity 90 to 95 RH
Duration 500 12 hrs
Recovery 2 to 3 hrs of recovery under the
standard condition after the removal from test
chamber. See Note 1
15 Loading under
Damp Heat
Appearance No signicant abnormality.
Impedance change Within
30
No
mechanical
damage.
Inductance
change
Within 20
Q change
Within 30
No
mechanical
damage.
Induc-
tance
change
Within
30
No
mechanical
damage.
Induc-
tance
change
Within
10
Q
change
Within
30
No
mechanical
damage.
Induc-
tance
change
0.047 to
12.0 H
Within
10
15.0 to
33.0 H
Within
15
Q
change
Within
No
mechanical
damage.
Induc-
tance
change
Within
20
Q
change
Within
No mechanical damage.
Inductance change Within
10
Q change Within
20
BK Series
Temperature 40 2
Humidity 90 to 95 RH
Duration 500
24
0 hrs
Recovery 2 to 3 hrs of recovery under the
standard condition after the removal from test
chamber. See Note 1
LK CK CKP HK HKQ AQ Series
Temperature 40 2
LK CK CKPSeries
60 2
HK HKQ AQ Series
Humidity 90 to 95 RH
Duration 500 12 hrs
Recovery 2 to 3 hrs of recovery under the
standard condition after the removal from test
chamber. See Note 1
16 Loading at High
Temperature
Appearance No signicant abnormality.
Impedance change Within
30
No
mechanical
damage.
Inductance
change
Within 20
Q change
Within 30
No
mechanical
damage.
Induc-
tance
change
Within
30
No
mechanical
damage.
Induc-
tance
change
Within
10
Q
change
Within
30
No
mechanical
damage.
Induc-
tance
change
0.047 to
12.0 H
Within
10
15.0 to
33.0 H
Within
15
Q
change
Within
30
No
mechanical
damage.
Induc-
tance
change
Within
20
Q
change
Within
30
No mechanical damage.
Inductance change Within
10
Q change Within
20
BK Series
Temperature 125 3
Applied current Rated current
Duration 500
24
0 hrs
Recovery 2 to 3 hrs of recovery under the
standard condition after the removal from test
chamber. See Note 1
LK CK CKP HK HKQ AQ Series BK Series
P type
Temperature 85 2
LK CK CKPSeries
85 3
BK Series P type
85 2
HK1608 2125)
85 2
HK1005, AQ105 operating
temperature range -55 to +85
125 2
HK0603 HK1005, HKQ0603S
AQ105 operating temperature range -55 to +125
Applied current Rated current
Duration 500 12 hrs
Recovery 2 to 3 hrs of recovery under the
standard condition after the test. See Note 1
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