参数资料
型号: HT2MOA3S20
厂商: NXP Semiconductors N.V.
英文描述: HITAGTM2 Chip Module
中文描述: HITAGTM2芯片模块
文件页数: 19/22页
文件大小: 161K
代理商: HT2MOA3S20
Specifications of the HT2 MOA3 S20
Rev. 1.1
1997-08-19
Ht2moa3.doc/HS
Page 19 of 22
7 Characterisation and Test of the Final Transponder
7.1 Characterisation of the Transponder
The parameters recommended to be characterised for the transponder are:
Parameter
Comment
Resonant frequency
f
res
Transponder does not modulate
Resonant frequency @ T
amb
= 22°C, @ B
TH
Threshold value
B
TH
Start of modulation
Threshold value for READ
B
RD
Command READ_PAGE OK
Threshold value for WRITE
B
WR
Command WRITE_PAGE OK
For the measurement of these parameters we recommend to use the test equipment available from
SCEMTEC, Marienheide-Rodt, Germany (Transponder Measurement System STM-1).
This device also supports functional testing (besides parameter testing). Therefore it can also be
used as production test equipment for the final transponder test. For further information please
contact Scemtec GmbH.
7.2 Final Test of the Transponder
In addition to the equipment described in the previous chapter Philips Semiconductors offers a
device for a final functional test of transponders, the HITAG
TM
Test System HT OT490.
Parameter tests are not supportet by this device.
Basic flow for production and test:
1. Assembly of transponders
2. Functional test and final test of the EEPROM
Since the Keys and Logdata are changed during final test the Configuration and
personalization must take place after the final test. The final test is disabled (not reversible)
by setting the Tag-test mode bit to 0.
For the final test of transponders we recommend to use the
HITAG
TM
Test System HT OT490 of Philips Semiconductors or the
Transponder Measurement System STM-1 of Scemtec.
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