参数资料
型号: HUF75545S3
厂商: Fairchild Semiconductor
文件页数: 2/10页
文件大小: 0K
描述: MOSFET N-CH 80V 75A TO-262AA
标准包装: 400
系列: UltraFET™
FET 型: MOSFET N 通道,金属氧化物
FET 特点: 逻辑电平门
漏极至源极电压(Vdss): 80V
电流 - 连续漏极(Id) @ 25° C: 75A
开态Rds(最大)@ Id, Vgs @ 25° C: 10 毫欧 @ 75A,10V
Id 时的 Vgs(th)(最大): 4V @ 250µA
闸电荷(Qg) @ Vgs: 235nC @ 20V
输入电容 (Ciss) @ Vds: 3750pF @ 25V
功率 - 最大: 270W
安装类型: 通孔
封装/外壳: TO-262-3,长引线,I²Pak,TO-262AA
供应商设备封装: TO-262AA
包装: 管件
HUF75545P3, HUF75545S3S
Electrical Specifications
T C = 25 o C , Unless Otherwise Specified
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNITS
OFF STATE SPECIFICATIONS
Drain to Source Breakdown Voltage
Zero Gate Voltage Drain Current
Gate to Source Leakage Current
BV DSS
I DSS
I GSS
I D = 250 μ A, V GS = 0V (Figure 11)
V DS = 75V, V GS = 0V
V DS = 70V, V GS = 0V, T C = 150 o C
V GS = ± 20V
80
-
-
-
-
-
-
-
-
1
250
± 100
V
μ A
μ A
nA
ON STATE SPECIFICATIONS
Gate to Source Threshold Voltage
Drain to Source On Resistance
V GS(TH)
r DS(ON)
V GS = V DS , I D = 250 μ A (Figure 10)
I D = 75A, V GS = 10V (Figure 9)
2
-
-
0.0082
4
0.010
V
?
THERMAL SPECIFICATIONS
Thermal Resistance Junction to Case
Thermal Resistance Junction to
R θ JC
R θ JA
TO-220 and TO-263
-
-
-
-
0.55
62
o C/W
o C/W
Ambient
SWITCHING SPECIFICATIONS (V GS = 10V)
Turn-On Time
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Turn-Off Time
t ON
t d(ON)
t r
t d(OFF)
t f
t OFF
V DD = 40V, I D = 75A
V GS = 10V,
R GS = 2.5 ?
-
-
-
-
-
-
-
14
125
40
90
-
210
-
-
-
-
195
ns
ns
ns
ns
ns
ns
GATE CHARGE SPECIFICATIONS
Total Gate Charge
Gate Charge at 10V
Threshold Gate Charge
Gate to Source Gate Charge
Gate to Drain “Miller” Charge
Q g(TOT)
Q g(10)
Q g(TH)
Q gs
Q gd
V GS = 0V to 20V
V GS = 0V to 10V
V GS = 0V to 2V
V DD = 40V,
I D = 75A,
I g(REF) = 1.0mA
(Figure 13)
-
-
-
-
-
195
105
6.8
15
43
235
125
8.2
-
-
nC
nC
nC
nC
nC
CAPACITANCE SPECIFICATIONS
Input Capacitance
C ISS
V DS = 25V, V GS = 0V,
-
3750
-
pF
f = 1MHz
Output Capacitance
Reverse Transfer Capacitance
C OSS
C RSS
(Figure 12)
-
-
1100
350
-
-
pF
pF
Source to Drain Diode Specifications
PARAMETER
Source to Drain Diode Voltage
Reverse Recovery Time
Reverse Recovered Charge
SYMBOL
V SD
t rr
Q RR
TEST CONDITIONS
I SD = 75A
I SD = 35A
I SD = 75A, dI SD /dt = 100A/ μ s
I SD = 75A, dI SD /dt = 100A/ μ s
MIN
-
-
-
-
TYP
-
-
-
-
MAX
1.25
1.00
100
300
UNITS
V
V
ns
nC
?2002 Fairchild Semiconductor Corporation
HUF75545P3 / HUF75545S3S Rev. C 1
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