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参数资料
| 型号： | HY57V281620A |
| 英文描述： | 4 Banks x 2M x 16Bit Synchronous DRAM(4组x 2M x 16位同步动态RAM) |
| 中文描述： | 4银行x 2米× 16位同步DRAM（4组× 2米× 16位同步动态RAM）的 |
| 文件页数： | 4/13页 |
| 文件大小： | 111K |
| 代理商： | HY57V281620A |
HY57V281620A
Rev. 1.0/Dec.99
4
ABSOLUTE MAXIMUM RATINGS
Note :
Operation at above absolute maximum rating can adversely affect device reliability.
DC OPERATING CONDITION
(T
A
=0 to 70
°
C
)
Note :
1.All voltages are referenced to V
SS
= 0V
2.V
IH
(max) is acceptable 5.6V AC pulse width with <=3ns of duration.
3.V
IL
(min) is acceptable -2.0V AC pulse width with <=3ns of duration.
AC OPERATING TEST CONDITION
(T
A
=0 to 70
°
C
, V
DD
=3.3
±
0.3V, V
SS
=0V)
Note :
1.Output load to measure access times is equivalent to two TTL gates and one capacitor (50pF). For details, refer to AC/DC output
load circuit
Parameter
Symbol
Rating
Unit
Ambient Temperature
T
A
0 ~ 70
°
C
Storage Temperature
T
STG
-55 ~ 125
°
C
Voltage on Any Pin relative to V
SS
V
IN
, V
OUT
-1.0 ~ 4.6
V
Voltage on V
DD
relative to V
SS
V
DD,
V
DDQ
-1.0 ~ 4.6
V
Short Circuit Output Current
I
OS
50
mA
Power Dissipation
P
D
1
W
Soldering Temperature
Time
T
SOLDER
260
10
°
C
Sec
Parameter
Symbol
Min
Typ
Max
Unit
Note
Power Supply Voltage
V
DD
, V
DDQ
3.0
3.3
3.6
V
1
Input High voltage
V
IH
2.0
3.0
V
DDQ
+ 0.3
V
1,2
Input Low voltage
V
IL
-0.3
0
0.8
V
1,3
Parameter
Symbol
Value
Unit
Note
AC Input High / Low Level Voltage
V
IH
/ V
IL
2.4/0.4
V
Input Timing Measurement Reference Level Voltage
Vtrip
1.4
V
Input Rise / Fall Time
tR / tF
1
ns
Output Timing Measurement Reference Level Voltage
Voutref
1.4
V
Output Load Capacitance for Access Time Measurement
C
L
50
pF
1
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相关代理商/技术参数 |
参数描述 |
|---|---|
| HY57V281620ALT | 制造商:未知厂家 制造商全称:未知厂家 功能描述:8Mx16|3.3V|4K|6|SDR SDRAM - 128M |
| HY57V281620ALT-10 | 制造商:未知厂家 制造商全称:未知厂家 功能描述:x16 SDRAM |
| HY57V281620ALT-6 | 制造商:HYNIX 制造商全称:Hynix Semiconductor 功能描述:4 Banks x 2M x 16bits Synchronous DRAM |
| HY57V281620ALT-7 | 制造商:未知厂家 制造商全称:未知厂家 功能描述:x16 SDRAM |
| HY57V281620ALT-8 | 制造商:未知厂家 制造商全称:未知厂家 功能描述:x16 SDRAM |
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