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参数资料
| 型号： | ICSSSTV16859YKLF |
| 厂商： | INTEGRATED DEVICE TECHNOLOGY INC |
| 元件分类： | 锁存器 |
| 英文描述： | SSTV SERIES, POSITIVE EDGE TRIGGERED D FLIP-FLOP, TRUE OUTPUT, CQCC56 |
| 封装： | VFQFN-56 |
| 文件页数： | 6/8页 |
| 文件大小： | 91K |
| 代理商： | ICSSSTV16859YKLF |
6
ICSSSTV16859
0003G—05/21/02
Notes:
1. CL incluces probe and jig capacitance.
2. IDD tested with clock and data inputs held at VDDQ or GND, and IO = 0 mA.
3. All input pulses are supplied by generators having the following characteristics: PRR @10 MHz,
Zo=50W, input slew rate = 1 V/ns ±20% (unless otherwise specified).
4. The outputs are measured one at a time with one transition per measurement.
5. VTT = VREF = VDDQ/2
6. VIH = VREF + 310mV (AC voltage levels) for differential inputs. VIH = VDDQ for LVCMOS input.
7. VIL = VREF - 310mV (AC voltage levels) for differential inputs. VIL = GND for LVCMOS input.
8. tPLH and tPHL are the same as tpd
Test Point
Load Circuit
From Output
Under Test
C= 30 pF
(see Note 1)
L
VTT
R =
L 50W
LVCMOS
RESET#
Input
LVCMOS
RESET#
Input
V
DDQ
/2
V
DDQ
/2
tinact
tact
I
(see note 2)
DD
IDDH
IDDL
10%
90%
Voltage and Current Waveforms
Inputs Active and Inactive Times
Voltage Waveforms - Propagation Delay Times
Figure 1 - Parameter Measurement Information (V
DDQ = 2.5V ±0.2V)
Voltage Waveforms - Pulse Duration
Voltage Waveforms - Setup and Hold Times
VDDQ
0V
t
w
t
S
t
h
VIH
VOH
VTT
VOH
VIH
VIL
VOL
VI(pp)
VIL
VREF
VICR
tPHL
V/2
DD
VICR
Input
Timing
Input
Timing
Input
Output
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