参数资料
型号: IDT70121L35J
厂商: IDT, Integrated Device Technology Inc
文件页数: 9/15页
文件大小: 0K
描述: IC SRAM 18KBIT 35NS 52PLCC
标准包装: 24
格式 - 存储器: RAM
存储器类型: SRAM - 双端口,异步
存储容量: 18K(2K x 9)
速度: 35ns
接口: 并联
电源电压: 4.5 V ~ 5.5 V
工作温度: 0°C ~ 70°C
封装/外壳: 52-LCC(J 形引线)
供应商设备封装: 52-PLCC(19x19)
包装: 管件
其它名称: 70121L35J
IDT70121/IDT70125
High-Speed 2K x 9 Dual-Port Static RAM with Busy & Interrupt
Industrial and Commercial Temperature Ranges
Timing Waveform of Write Cycle No. 1, R/ W Controlled Timing (1,5,8)
t WC
ADDRESS
t HZ (7)
OE
CE
t AW
t WR (3)
R/ W
t AS (6)
t WP (2)
t HZ
(7)
t WZ (7)
t OW
DATA OUT
(4)
t DW
t DH
(4)
DATA IN
2654 drw 07
Timing Waveform of Write Cycle No. 2, CE Controlled Timing (1,5)
t WC
ADDRESS
t AW
CE
t AS (6)
t EW (2)
t WR
(3)
R/ W
t DW
t DH
DATA IN
2654 drw 08
NOTES:
1. R/ W or CE must be HIGH during all address transitions.
2. A write occurs during the overlap (t EW or t WP ) of a CE = V IL and a R/ W = V IL
3. t WR is measured from the earlier of CE or R/ W going HIGH to the end of the write cycle.
4. During this period, the I/O pins are in the output state and input signals must not be applied.
5. If the CE LOW transition occurs simultaneously with or after the R/ W LOW transition, the outputs remain in the High-impedance state.
6. Timing depends on which enable signal ( CE or R/ W ) is asserted last.
7. This parameter is determined be device characterization, but is not production tested. Transition is measured 0mV from steady state with the Output Test Load
(Figure 2).
8. If OE is LOW during a R/ W controlled write cycle, the write pulse width must be the larger of t WP or (t WZ + t DW ) to allow the I/O drivers to turn off data to be
placed on the bus for the required t DW . If OE is HIGH during a R/ W controlled write cycle, this requirement does not apply and the write pulse can be as short
as the specified t WP .
9
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