参数资料
型号: IDT7038L15PF
厂商: IDT, Integrated Device Technology Inc
文件页数: 7/17页
文件大小: 0K
描述: IC SRAM 1.125MBIT 15NS 100TQFP
标准包装: 6
格式 - 存储器: RAM
存储器类型: SRAM - 双端口,异步
存储容量: 1.125M(64K x 18)
速度: 15ns
接口: 并联
电源电压: 4.5 V ~ 5.5 V
工作温度: 0°C ~ 70°C
封装/外壳: 100-LQFP
供应商设备封装: 100-TQFP(14x14)
包装: 托盘
其它名称: 7038L15PF
IDT7038L
High-Speed 64K x 18 Dual-Port Static RAM
Industrial and Commercial Temperature Ranges
AC Electrical Characteristics Over the
Operating Temperature and Supply Voltage Range
7038L15
Com'l Only
7038L20
Com'l & Ind
Symbol
Parameter
Min.
Max.
Min.
Max.
Unit
READ CYCLE
t RC
t AA
Read Cycle Time
Address Access Time
15
____
____
15
20
____
____
20
ns
ns
t ACE
Chip Enable Access Time
(4)
____
15
____
20
ns
t AOE
t OH
Output Enable Access Time
Output Hold from Address Change
____
3
10
____
____
3
12
____
ns
ns
t LZ
Output Low-Z Time
(1,2)
3
____
3
____
ns
t HZ
t PU
Output High-Z Time (1,2)
Chip Enable to Power Up Time (2)
____
0
10
____
____
0
10
____
ns
ns
t PD
Chip Disable to Power Down Time
(2)
____
15
____
20
ns
t SOP
t SAA
Semaphore Flag Update Pulse ( OE or SEM )
Semaphore Address Access Time
10
____
____
15
10
____
____
20
ns
ns
4837 tbl 12
AC Electrical Characteristics Over the
Operating Temperature and Supply Voltage
7038L15
Com'l Only
7038L20
Com'l & Ind
Symbol
Parameter
Min.
Max.
Min.
Max.
Unit
WRITE CYCLE
t WC
t EW
t AW
Write Cycle Time
Chip Enable to End-of-Write (3)
Address Valid to End-of-Write
15
12
12
____
____
____
20
15
15
____
____
____
ns
ns
ns
t AS
Address Set-up Time
(3)
0
____
0
____
ns
t WP
t WR
t DW
Write Pulse Width
Write Recovery Time
Data Valid to End-of-Write
12
0
10
____
____
____
15
0
15
____
____
____
ns
ns
ns
t HZ
Output High-Z Time
(1,2)
____
10
____
10
ns
t DH
Data Hold Time
(4)
0
____
0
____
ns
Write Enable to Output in High-Z
t WZ
(1,2)
____
10
____
10
ns
t OW
t SWRD
t SPS
Output Active from End-of-Write
SEM Flag Write to Read Time
SEM Flag Contention Window
(1,2,4)
0
5
5
____
____
____
0
5
5
____
____
____
ns
ns
ns
NOTES:
4837 tbl 13
1. Transition is measured 0mV from Low or High-impedance voltage with Output Test Load (Figure 2).
2. This parameter is guaranted by device characterization, but is not production tested.
3. To access RAM, CE = V IL and SEM = V IH . To access semaphore, CE = V IH and SEM = V IL . Either condition must be valid for the entire t EW time.
4. The specification for t DH must be met by the device supplying write data to the RAM under all operating conditions. Although t DH and t OW values will vary over voltage
and temperature, the actual t DH will always be smaller than the actual t OW .
7
6.42
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