参数资料
型号: IDT70V9279L6PRF8
厂商: IDT, Integrated Device Technology Inc
文件页数: 8/19页
文件大小: 0K
描述: IC SRAM 512KBIT 6NS 128TQFP
标准包装: 1,000
格式 - 存储器: RAM
存储器类型: SRAM - 双端口,同步
存储容量: 512K (32K x 16)
速度: 6ns
接口: 并联
电源电压: 3 V ~ 3.6 V
工作温度: 0°C ~ 70°C
封装/外壳: 128-LQFP
供应商设备封装: 128-TQFP(14x20)
包装: 带卷 (TR)
其它名称: 70V9279L6PRF8
IDT70V9279/69S/L
High-Speed 32/16K x 16 Dual-Port Synchronous Static RAM
Industrial and Commercial Temperature Ranges
AC Electrical Characteristics Over the Operating Temperature Range
(Read and Write Cycle Timing) (3,4) (V DD = 3.3V ± 0.3V, T A = 0°C to +70°C)
70V9279/69X6
Com'l Only
70V9279/69X7
Com'l
& Ind
70V9279/69X9
Com'l Only
Symbol
Parameter
Min.
Max.
Min.
Max.
Min.
Max.
Unit
t CYC1
Clock Cycle Time (Flow-Through)
(2)
19
____
22
____
25
____
ns
t CYC2
Clock Cycle Time (Pipelined)
(2)
10
____
12
____
15
____
ns
t CH1
Clock High Time (Flow-Through) (2)
6.5
____
7.5
____
12
____
ns
t CL1
Clock Low Time (Flow-Through)
(2)
6.5
____
7.5
____
12
____
ns
t CH2
Clock High Time (Pipelined)
(2)
4
____
5
____
6
____
ns
t CL2
Clock Low Time (Pipelined)
(2)
4
____
5
____
6
____
ns
Output Enable to Output Low-Z
Output Enable to Output High-Z
Clock High to Output High-Z
Clock High to Output Low-Z
t R
t F
t SA
t HA
t SC
t HC
t SW
t HW
t SD
t HD
t SAD
t HAD
t SCN
t HCN
t SRST
t HRST
t OE
t OLZ
t OHZ
t CD1
t CD2
t DC
t CKHZ
t CKLZ
Clock Rise Time
Clock Fall Time
Address Setup Time
Address Hold Time
Chip Enable Setup Time
Chip Enable Hold Time
R/W Setup Time
R/W Hold Time
Input Data Setup Time
Input Data Hold Time
ADS Setup Time
ADS Hold Time
CNTEN Setup Time
CNTEN Hold Time
CNTRST Setup Time
CNTRST Hold Time
Output Enable to Data Valid
(1)
(1)
Clock to Data Valid (Flow-Through) (2)
Clock to Data Valid (Pipelined) (2)
Data Output Hold After Clock High
(1)
(1)
____
____
3.5
0
3.5
0
3.5
0
3.5
0
3.5
0
3.5
0
3.5
0
____
2
1
____
____
2
2
2
3
3
____
____
____
____
____
____
____
____
____
____
____
____
____
____
6.5
____
7
15
6.5
____
9
____
____
____
4
0
4
0
4
0
4
0
4
0
4
0
4
0
____
2
1
____
____
2
2
2
3
3
____
____
____
____
____
____
____
____
____
____
____
____
____
____
7.5
____
7
18
7.5
____
9
____
____
____
4
1
4
1
4
1
4
1
4
1
4
1
4
1
____
2
1
____
____
2
2
2
3
3
____
____
____
____
____
____
____
____
____
____
____
____
____
____
9
____
7
20
9
____
9
____
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Port-to-Port Delay
t CWDD
t CCS
Write Port Clock High to Read Data Delay
Clock-to-Clock Setup Time
____
____
24
9
____
____
28
10
____
____
35
15
ns
ns
NOTES:
3743 tbl 11a
1. Transition is measured 0mV from Low or High-impedance voltage with the Output Test Load (Figure 2). This parameter is guaranteed by device characteriza-
tion, but is not production tested.
2. The Pipelined output parameters (t CYC2 , t CD2 ) apply to either or both left and right ports when FT /PIPE = V IH . Flow-through parameters (t CYC1 , t CD1 ) apply when
FT /PIPE = V IL for that port.
3. All input signals are synchronous with respect to the clock except for the asynchronous Output Enable ( OE ) and FT /PIPE. FT /PIPE should be treated as a
DC signal, i.e. steady state during operation.
4. 'X' in part number indicates power rating (S or L).
8
6.42
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