参数资料
型号: IDT71V30L25TFG
厂商: IDT, Integrated Device Technology Inc
文件页数: 7/14页
文件大小: 0K
描述: IC SRAM 8KBIT 25NS 64TQFP
标准包装: 40
格式 - 存储器: RAM
存储器类型: SRAM - 双端口,异步
存储容量: 8K (1K x 8)
速度: 25ns
接口: 并联
电源电压: 3 V ~ 3.6 V
工作温度: 0°C ~ 70°C
封装/外壳: 64-LQFP
供应商设备封装: 64-TQFP(10x10)
包装: 托盘
其它名称: 71V30L25TFG
IDT71V30S/L
High-Speed 1K x 8 Dual-Port Static RAM with Interrupts
Industrial and Commercial Temperature Ranges
AC Electrical Characteristics Over the
Operating Temperature and Supply Voltage (4,5)
71V30X25
Com'l Only
71V30X35
Com'l & Ind
71V30X55
Symbol
Parameter
Min.
Max.
Min.
Max.
Min.
Max.
Unit
WRITE CYCLE
t WC
t EW
t AW
t AS
t WP
t WR
t DW
t HZ
Write Cycle Time
Chip Enable to End-of-Write
Address Valid to End-of-Write
Address Set-up Time
Write Pulse Width
Write Recovery Time
Data Valid to End-of-Write
Output High-Z Time (1,2)
25
20
20
0
20
0
12
____
____
____
____
____
____
____
____
12
35
30
30
0
30
0
20
____
____
____
____
____
____
____
____
15
55
40
40
0
40
0
20
____
____
____
____
____
____
____
____
30
ns
ns
ns
ns
ns
ns
ns
ns
t DH
Data Hold Time
(3)
0
____
0
____
0
____
ns
Write Enable to Output in High-Z
t WZ
(1,2)
____
15
____
15
____
30
ns
t OW
Output Active from End-of-Write
(1,2,3)
0
____
0
____
0
____
ns
3741 tbl 10
NOTES:
1. Transition is measured 0mV from Low- or High-impedance voltage with Output Test Load (Figure 2).
2. This parameter is guaranteed by device characterization, but is not production tested.
3. The specification for t DH must be met by the device supplying write data to the SRAM under all operating conditions. Although t DH and t OW values will vary over voltage and
temperature, the actual t DH will always be smaller than the actual t OW .
4. 'X' in part number indicates power rating (S or L).
5. Industrial temperatures: for specific speeds, packages and powers contact your sales office.
7
6.42
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