参数资料
型号: IGB01N120H2
厂商: INFINEON TECHNOLOGIES AG
英文描述: HighSpeed 2-Technology
中文描述: 高速2 -技术
文件页数: 7/13页
文件大小: 390K
代理商: IGB01N120H2
IGP01N120H2,
IGD01N120H2
IGB01N120H2
Power Semiconductors
7
Rev. 2, Mar-04
E
,
S
0A
1A
2A
3A
0.0mJ
0.2mJ
0.4mJ
0.6mJ
E
on
1
E
off
E
ts
1
E
,
S
50
100
150
200
0.05mJ
0.10mJ
0.15mJ
0.20mJ
0.25mJ
E
ts
1
E
on
1
E
off
I
C
,
COLLECTOR CURRENT
Figure 13. Typical switching energy losses
as a function of collector current
(inductive load,
T
j
= 150
°
C,
V
CE
= 800V,
V
GE
= +15V/0V,
R
G
= 241
,
dynamic test circuit in Fig.E )
R
G
,
GATE RESISTOR
Figure 14. Typical switching energy losses
as a function of gate resistor
(inductive load,
T
j
= 150
°
C,
V
CE
= 800V,
V
GE
= +15V/0V,
I
C
= 1A,
dynamic test circuit in Fig.E )
E
,
S
-40°C
25°C
100°C
150°C
0.00mJ
0.05mJ
0.10mJ
0.15mJ
0.20mJ
0.25mJ
E
ts
1
E
on
1
E
off
E
o
,
T
0V/us
1000V/us
2000V/us
3000V/us
0.00mJ
0.02mJ
0.04mJ
0.06mJ
I
C
=0.3A,
T
J
=150°C
I
C
=0.3A,
T
J
=25°C
I
C
=1A,
T
J
=150°C
I
C
=1A,
T
J
=25°C
T
j
,
JUNCTION TEMPERATURE
Figure 15. Typical switching energy losses
as a function of junction temperature
(inductive load,
V
CE
= 800V,
V
GE
= +15V/0V,
I
C
= 1A,
R
G
= 241
,
dynamic test circuit in Fig.E )
dv/dt
, VOLTAGE
SLOPE
Figure 16. Typical turn off switching energy
loss for soft switching
(
dynamic test circuit in Fig. E
)
1
)
E
on
and
E
ts
include losses
due to diode recovery.
1
)
E
and
E
include losses
due to diode recovery.
1
)
E
and
E
include losses
due to diode recovery.
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