参数资料
型号: IRPLDIM3
厂商: International Rectifier
文件页数: 26/27页
文件大小: 0K
描述: KIT DES FLUOR BALLAST IRS2158D
标准包装: 1
主要目的: 照明,镇流器控制
嵌入式:
已用 IC / 零件: IRS2158D
主要属性: 28W TL5,可调光,PFC,灯开路、使用寿命结束和断电保护
次要属性: 点火预热
已供物品: 板,CD
相关产品: IRS2158DSPBF-ND - IC DVR HALF BRIDGE 600V 16-SOIC
IRS2158DPBF-ND - IC DVR HALF BRIDGE 600V 16-PDIP
IRS2158DSTRPBF-ND - IC BALLAST CTRL 600V 16-SOIC
Fig 19. Brownout shutdown and restart
Trace
2
3
4
Color
Red
Blue
Green
Signal
VDC Pin Voltage
Lamp Arc Current
Lamp Voltage
The IRPLDIM3 ballast also includes end of life protection, which is enabled only after successful
ignition when the ballast is in run mode. The lamp voltage is divided down through REOL1, REOL2,
REOL3 and REOL4. This divided voltage is fed to two back to back zener diodes, DEOL1 (7.5 V) and
DEOL2 (5.1 V). The SD pin is internally biased at 2 V with a window comparator that has 1 V and 3 V
thresholds. If the positive peak of the lamp voltage becomes large enough to allow DEOL1 to reverse
breakdown then the SD pin voltage will rise above 3 V. A delay is incorporated by clocking the oscillator
pulses with the fault counter so that after a number of cycles the IRS2158D will shut down. The delay is
normally around 1ms and was added to provide some immunity to transients and false shutting down of the
end of life circuit. In the same way if the negative peak of the lamp voltage drops low enough for DEOL2
to reverse breakdown then the SD pin will fall below 1 V. After the same delay period the IRS2158D will
also shut down. This end of life circuit will therefore cause the ballast to shut down if an aging lamp is
connected if it produces an asymmetric voltage in either direction, due to the rectifying effect.
End of lamp life shutdown is often a mandatory requirement for electronic ballasts.
In the event of a ballast output becoming open circuit during running, for example if the lamp is
broken or cracked but the filament is still intact, the SD pin will not detect a fault. However the ballast will
still shut down because the CS pin will detect the transients caused by hard switching of the half bridge
MOSFETs. In this case the fault counter will be active so that approximately 60 consecutive transients need
to be detected by the CS pin before shut down. The broken lamp test is easily simulated by disconnecting
the high voltage end of the lamp during running, which is the end that is not connected to the SD pin lamp
out detection circuit.
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