参数资料
型号: ISL59483IRZ-T13
厂商: INTERSIL CORP
元件分类: 运动控制电子
英文描述: Dual, 500MHz Triple, Multiplexing Amplifiers
中文描述: TRIPLE 2-CHANNEL, VIDEO MULTIPLEXER, PQCC48
封装: 7 X 7 MM, ROHS COMPLIANT, PLASTIC, QFN-48
文件页数: 11/17页
文件大小: 909K
代理商: ISL59483IRZ-T13
11
FN6394.1
December 22, 2006
FIGURE 36. MUX 1: HIZ SWITCHING GLITCH V
IN
= 0V
FIGURE 37. MUX 2: HIZ SWITCHING GLITCH V
IN
= 0V
FIGURE 38. MUX 1: HIZ TRANSIENT RESPONSE V
IN
= 1V
FIGURE 39. MUX 2: HIZ TRANSIENT RESPONSE V
IN
= 1V
FIGURE 40. PACKAGE POWER DISSIPATION vs AMBIENT
TEMPERATURE
FIGURE 41. PACKAGE POWER DISSIPATION vs AMBIENT
TEMPERATURE
Typical Performance Curves
V
S
= ±5V, R
L
= 500
Ω
to GND, T
A
= +25°C, unless otherwise specified.
(Continued)
1
2
10ns/DIV
0
0
V
IN
= 0V
V
OUT
A, B, C
HIZ
50
Ω
TERM.
1
2
20ns/DIV
0
0
V
IN
= 0V
V
OUT
A, B, C
HIZ
50
Ω
TERM.
V
IN
=1V
1
1
10ns/DIV
0
0
V
OUT
A, B, C
50
Ω
TERM.
HIZ
V
IN
= 1V
1
2
20ns/DIV
0
0
V
OUT
A, B, C
50
Ω
TERM.
HIZ
JEDEC JESD51-7 HIGH EFFECTIVE THERMAL
CONDUCTIVITY TEST BOARD - QFN EXPOSED
DIEPAD SOLDERED TO PCB PER JESD51-5
6
5
4
3
2
1
0
0
25
50
75
100
150
AMBIENT TEMPERATURE (°C)
P
4.34W
θ
JA
=+23°C/
QFN48
125
85
JEDEC JESD51-3 LOW EFFECTIVE THERMAL
CONDUCTIVITY TEST BOARD - QFN EXPOSED
DIEPAD SOLDERED TO PCB PER JESD51-5
1.2
1.0
0.8
0.6
0.4
0.2
0.0
0
25
50
75
100
150
P
870mW
θ
JA
=+115°C/
QFN48
125
85
AMBIENT TEMPERATURE (°C)
ISL59483
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