参数资料
型号: JDV2S14E
元件分类: 变容二极管
英文描述: 60.5 pF, SILICON, VARIABLE CAPACITANCE DIODE
封装: 1-1G1A, 2 PIN
文件页数: 1/2页
文件大小: 116K
代理商: JDV2S14E
JDV2S14E
2007-11-01
1
TOSHIBA Diode Silicon Epitaxial Planar Type
JDV2S14E
Useful for VCO/TCXO
Small Package
High Capacitance Ratio: C1V/C2.5V = 2.15 (typ.)
Low Series Resistance : rs = 0.4 (typ.)
Absolute Maximum Ratings (Ta = 25°C)
Note: Using continuously under heavy loads (e.g. the application of high
temperature/current/voltage and the significant change in
temperature, etc.) may cause this product to decrease in the
reliability significantly even if the operating conditions (i.e. operating
temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba
Semiconductor Reliability Handbook (“Handling
Precautions”/“Derating Concept and Methods”) and individual
reliability data (i.e. reliability test report and estimated failure rate,
etc).
Electrical Characteristics (Ta = 25°C)
Characteristics
Symbol
Test Condition
Min
Typ.
Max
Unit
Reverse voltage
VR
IR = 1 μA
10
V
Reverse current
IR
VR = 10 V
3
nA
C0.5V
VR = 0.5 V, f = 1 MHz
56.3
64.7
C1V
VR = 1 V, f = 1 MHz
44
49.5
C2.5V
VR = 2.5 V, f = 1 MHz
19
26.5
Capacitance
C4V
VR = 4 V, f = 1 MHz
9.2
12
pF
C0.5V/C1V
1.25
1.35
Capacitance ratio
C1V/C2.5V
1.99
2.15
2.3
Series resistance
rs
VR = 4 V, f = 100 MHz
0.4
0.8
Ω
Note: Signal level when capacitance is measured. Vsig = 500 mVrms
Marking
Unit: mm
JEDEC
JEITA
TOSHIBA
1-1G1A
Weight: 0.0014 g (typ.)
Characteristics
Symbol
Rating
Unit
Reverse voltage
VR
10
V
Junction temperature
Tj
125
°C
Storage temperature range
Tstg
55~125
°C
F H
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