参数资料
型号: KIT33879AEKEVBE
厂商: Freescale Semiconductor
文件页数: 6/23页
文件大小: 0K
描述: BOARD EVALUATION FOR MC33879
标准包装: 1
主要目的: 电源管理,高端和低端驱动器(内部 FET)
嵌入式:
已用 IC / 零件: MC33879
主要属性: 8 个输出硬件-可配置
次要属性: 16 位串行输入控制
已供物品: 板,CD
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
Table 3. 33879 Maximum Ratings
All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or
permanent damage to the device.
Ratings
Symbol
Value
Unit
ELECTRICAL RATINGS
VDD Supply Voltage (1)
V DD
- 0.3 to 7.0
V DC
CS , DI, DO, SCLK, IN5, IN6, and EN
Voltage (1)
VPWR Supply
V PWR
- 0.3 to 7.0
V DC
V DC
33879
33879A
-16 to 40
-16 to 45
Output Clamp
Energy (2)
E CLAMP
50
mJ
ESD Voltage
V
THERMAL RATINGS
Operating Temperature
Ambient
Junction
Case
Human Body Model 33879
Machine Model 33879
Human Body Model 33879A
Machine Model 33879A
V ESD1
V ESD2
V ESD1
V ESD2
T A
T J
T C
± 450
±100
±2000
±200
- 40 to 125
- 40 to 150
- 40 to 125
? C
Storage Temperature
T STG
- 55 to 150
? C
Power Dissipation
P D
1.7
W
Thermal Resistance
? C/W
Junction to Ambient
Between the Die and the Exposed Die Pad
R ? JA
R ? JC
71
1.2
Peak Package Reflow Temperature During Reflow (5) , (6)
T PPRT
°C
Notes
1. Exceeding these limits may cause malfunction or permanent damage to the device.
2. Maximum output clamp energy capability at 150 ? C junction temperature using single non-repetitive pulse method with I = 350 mA.
3. ESD1 testing is performed in accordance with the Human Body Model (C ZAP = 100 pF, R ZAP = 1500 ? ), ESD2 testing is performed in
accordance with the Machine Model (C ZAP = 200 pF, R ZAP = 0 ? ).
4.
5.
6.
Maximum power dissipation at T A = 25 ? C with no heatsink used.
Pin soldering temperature limit is for 10 seconds maximum duration. Not designed for immersion soldering. Exceeding these limits may
cause malfunction or permanent damage to the device.
33879
Analog Integrated Circuit Device Data ?
6
Freescale Semiconductor
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