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| 型号： | KITMPR084EVM |
| 厂商： | Freescale Semiconductor |
| 文件页数： | 20/40页 |
| 文件大小： | 0K |
| 描述： | KIT EVAL 8-PAD TOUCH MPR084 |
| 标准包装： | 1 |
| 传感器类型： | 触摸，电容式 |
| 接口： | I²C |
| 电源电压： | 1.8 V ~ 3.6 V |
| 嵌入式： | 是，其它 |
| 已供物品： | 板，缆线，CD |
| 已用 IC / 零件： | MPR084 |
| 产品目录页面： | 2808 (CN2011-ZH PDF) |
| 相关产品： | MPR084EJR2CT-ND - IC CTLR TOUCH SENSR PROX 16TSSOP MPR084QR2-ND - IC CTLR TOUCH SENSOR PROX 16-QFN MPR084Q-ND - IC CTLR TOUCH SENSOR PROX 16-QFN MPR084EJR2TR-ND - IC CTLR TOUCH SENSR PROX 16TSSOP MPR084EJ-ND - IC CTLR TOUCH SENSR PROX 16TSSOP |
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MPR084
Sensors
Freescale Semiconductor
27
Appendix A Electrical Characteristics
A.1
Introduction
This section contains electrical and timing specifications.
A.2
Absolute Maximum Ratings
Absolute maximum ratings are stress ratings only, and functional operation at the maxima is not guaranteed. Stress beyond the
limits specified in Table A-1 may affect device reliability or cause permanent damage to the device. For functional operating
conditions, refer to the remaining tables in this section. This device contains circuitry protecting against damage due to high static
voltage or electrical fields; however, it is advised that normal precautions be taken to avoid application of any voltages higher
than maximum-rated voltages to this high-impedance circuit.
A.3
ESD and Latch-up Protection Characteristics
Normal handling precautions should be used to avoid exposure to static discharge.
Qualification tests are performed to ensure that these devices can withstand exposure to reasonable levels of static without
suffering any permanent damage. During the device qualification ESD stresses were performed for the Human Body Model
(HBM), the Machine Model (MM) and the Charge Device Model (CDM).
A device is defined as a failure if after exposure to ESD pulses the device no longer meets the device specification. Complete
DC parametric and functional testing is performed per the applicable device specification at room temperature followed by hot
temperature, unless specified otherwise in the device specification.
Table 20. Absolute Maximum Ratings - Voltage (with respect to VSS)
Rating
Symbol
Value
Unit
Supply Voltage
VDD
-0.3 to +3.8
V
Input Voltage
SCL, SDA, AD0, IRQ, ATTN,
SOUNDER
VIN
VSS - 0.3 to VDD + 0.3
V
Operating Temperature Range
TSG
-40 to +85
°C
Storage Temperature Range
TSG
-55 to +150
°C
Table 21. ESD and Latch-up Test Conditions
Rating
Symbol
Value
Unit
Human Body Model (HBM)
VESD
±2000
V
Machine Model (MM)
VESD
±200
V
Charge Device Model (CDM)
VESD
±500
V
Latch-up current at TA = 85°C
ILATCH
±100
mA
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