参数资料
型号: LIS302DLH
厂商: STMICROELECTRONICS
元件分类: 模拟信号调理
英文描述: SPECIALTY ANALOG CIRCUIT, PBGA14
封装: 3 X 5 MM, 0.80 MM HEIGHT, ROHS COMPLIANT, PLASTIC, LGA-14
文件页数: 37/37页
文件大小: 673K
代理商: LIS302DLH
LIS302DLH
Mechanical and electrical specifications
Doc ID 15797 Rev 1
9/37
2
Mechanical and electrical specifications
2.1
Mechanical characteristics
Table 3.
Mechanical characteristics @ Vdd = 2.5 V, T = 25 °C unless otherwise noted (1)
Symbol
Parameter
Test conditions
Min.
Typ.(2)
Max.
Unit
FS
Measurement range(3)
FS bit set to 00
±2.0
g
FS bit set to 01
±4.0
FS bit set to 11
±8.0
So
Sensitivity
FS bit set to 00
12 bit representation
0.911.1
m
g/digit
FS bit set to 01
12 bit representation
1.822.2
FS bit set to 11
12 bit representation
3.5
3.9
4.3
TCSo
Sensitivity change vs
temperature
FS bit set to 00
±0.01
%/°C
TyOff
Typical zero-
g level offset
accuracy(4),(5)
FS bit set to 00
±20
m
g
TCOff
Zero-
g level change vs
temperature
Max delta from 25 °C
±0.1
m
g/°C
An
Acceleration noise density
FS bit set to 00
218
g/
Vst
Self-test
output change(6),(7),(8)
FS bit set to 00
X axis
120
300
550
LSb
FS bit set to 00
Y axis
120
300
550
LSb
FS bit set to 00
Z axis
140
350
750
LSb
Top
Operating temperature range
-40
+85
°C
Wh
Product weight
20
mgram
1.
The product is factory calibrated at 2.5 V. The operational power supply range is from 2.16 V to 3.6 V.
2.
Typical specifications are not guaranteed
3.
Verified by wafer level test and measurement of initial offset and sensitivity
4.
Typical zero-
g level offset value after MSL3 preconditioning
5.
Offset can be eliminated by enabling the built-in high pass filter
6.
The sign of “Self-test output change” is defined by CTRL_REG4 STsign bit (
Table 28), for all axes.
7.
Self-test output changes with the power supply. “Self-test output change” is defined as
OUTPUT[LSb](CTRL_REG4 ST bit=1) - OUTPUT[LSb](CTRL_REG4 ST bit=0). 1LSb=4g/4096 at 12bit representation, ±2 g Full-scale
8.
Output data reach 99% of final value after 3/ODR when enabling self-test mode, due to device filtering
Hz
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