参数资料
型号: LIS33DE
厂商: STMICROELECTRONICS
元件分类: 模拟信号调理
英文描述: SPECIALTY ANALOG CIRCUIT, PBGA16
封装: 3 X 3 MM, 1 MM HEIGHT, GREEN, PLASTIC, LGA-16
文件页数: 5/31页
文件大小: 532K
代理商: LIS33DE
LIS33DE
Mechanical and electrical specifications
Doc ID 15596 Rev 1
13/31
2.5
Terminology
2.5.1
Sensitivity
Sensitivity describes the gain of the sensor and can be determined e.g. by applying 1g
acceleration to it. As the sensor can measure DC accelerations this can be done easily by
pointing the axis of interest towards the center of the earth, noting the output value, rotating
the sensor by 180 degrees (pointing to the sky) and noting the output value again. By doing
so, ±1g acceleration is applied to the sensor. Subtracting the larger output value from the
smaller one and dividing the result by 2, leads to the actual sensitivity of the sensor. This
value changes very little over temperature and also time. The Sensitivity tolerance describes
the range of sensitivities of a large population of sensors.
2.5.2
Zero-g level
Zero-g level Offset (TyOff) describes the deviation of an actual output signal from the ideal
output signal if no acceleration is present. A sensor in a steady state on a horizontal surface
measure 0g in X axis and 0g in Y axis whereas the Z axis measure 1g. The output is ideally
in the middle of the dynamic range of the sensor (content of OUT registers 00h, data
expressed as 2’s complement number). A deviation from ideal value in this case is called
Zero-g offset. Offset is to some extent a result of stress to MEMS sensor and therefore the
offset can slightly change after mounting the sensor onto a printed circuit board or exposing
it to extensive mechanical stress. Offset changes little over temperature, see “Zero-g level
change vs. temperature”. The Zero-g level tolerance (TyOff) describes the Standard
Deviation of the range of Zero-g levels of a population of sensors.
2.5.3
Self test
Self Test allows to check the sensor functionality without moving it. The Self Test function is
off when the self-test bit of CTRL_REG1 (control register 1) is programmed to ‘0‘. When the
self-test bit of CTRL_REG1 is programmed to ‘1‘ an actuation force is applied to the sensor,
simulating a definite input acceleration. In this case the sensor outputs exhibit a change in
their DC levels which are related to the selected full scale through the device sensitivity.
When self test is activated, the device output level is given by the algebraic sum of the
signals produced by the acceleration acting on the sensor and by the electrostatic test-force.
If the output signals change within the amplitude specified inside
Table 3, then the sensor is
working properly and the parameters of the interface chip are within the defined
specifications.
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LIS344ALH_0804 制造商:STMICROELECTRONICS 制造商全称:STMicroelectronics 功能描述:MEMS inertial sensor high performance 3-axis 【2/【6g ultracompact linear accelerometer
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