参数资料
型号: LTC1604CG#TRPBF
厂商: Linear Technology
文件页数: 8/20页
文件大小: 0K
描述: IC A/D CONV 16BIT SAMPLNG 36SSOP
标准包装: 2,000
位数: 16
采样率(每秒): 333k
数据接口: 并联
转换器数目: 1
功率耗散(最大): 350mW
电压电源: 双 ±
工作温度: 0°C ~ 70°C
安装类型: 表面贴装
封装/外壳: 36-SSOP(0.209",5.30mm 宽)
供应商设备封装: 36-SSOP
包装: 带卷 (TR)
输入数目和类型: 2 个单端,双极;1 个差分,双极
LTC1604
16
1604fa
APPLICATIONS INFORMATION
1604 F16
AIN
+
VSS
OVDD
DGND
AVDD
LTC1604
DIGITAL
SYSTEM
ANALOG
INPUT
CIRCUITRY
AGND
5 TO 8
2
34
29
DVDD
OGND
28
10
1
REFCOMP
4
47μF
VREF
3
2.2μF
AIN
10μF
36
10μF
AVDD
35
10μF
+
9
10μF
CODE
–5 –4 –3 –2 –1 0
1
2
3
4
5
COUNT
2500
2000
1500
1000
500
0
1604 F17
FREQUENCY (kHz)
0
AMPLITUDE
(dB)
–60
–40
–20
60
1604 F18a
–80
–100
20
40
80 100 120 140 160
–120
–140
0
fSAMPLE = 333kHz
fIN = 4.959kHz
SINAD = 90.2dB
THD = –103.2dB
Figure 16. Power Supply Grounding Practice
Figure 17. Histogram for 4096 Conversions
Figure 18a. This FFT of the LTC1604’s Conversion of a
Full-Scale 5kHz Sine Wave Shows Outstanding Response
with a Very Low Noise Floor When Sampling at 333ksps
DC PERFORMANCE
The noise of an ADC can be evaluated in two ways: signal-
to-noise raio (SNR) in frequency domain and histogram
in time domain. The LTC1604 excels in both. Figure 18a
demonstrates that the LTC1604 has an SNR of over 90dB
in frequency domain. The noise in the time domain
histogram is the transition noise associated with a high
resolution ADC which can be measured with a fixed DC
signal applied to the input of the ADC. The resulting output
codes are collected over a large number of conversions.
The shape of the distribution of codes will give an indica-
tion of the magnitude of the transition noise. In Figure 17
the distribution of output codes is shown for a DC input
that has been digitized 4096 times. The distribution is
Gaussian and the RMS code transition noise is about
0.66LSB. This corresponds to a noise level of 90.9dB
relative to full scale. Adding to that the theoretical 98dB
of quantization error for 16-bit ADC, the resultant corre-
sponds to an SNR level of 90.1dB which correlates very
well to the frequency domain measurements in DYNAMIC
PERFORMANCE section.
DYNAMIC PERFORMANCE
The LTC1604 has excellent high speed sampling capability.
Fast fourier transform (FFT) test techniques are used to test
the ADC’s frequency response, distortions and noise at the
rated throughput. By applying a low distortion sine wave
and analyzing the digital output using an FFT algorithm,
the ADC’s spectral content can be examined for frequen-
cies outside the fundamental. Figures 18a and 18b show
typical LTC1604 FFT plots.
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