参数资料
型号: LV5050NV-TLM-E
厂商: ON Semiconductor
文件页数: 1/7页
文件大小: 0K
描述: IC REG CTRLR BUCK PWM 20-SSOP
标准包装: 2,000
PWM 型: 控制器
输出数: 1
频率 - 最大: 1.1MHz
电源电压: 4.5 V ~ 16 V
降压:
升压:
回扫:
反相:
倍增器:
除法器:
Cuk:
隔离:
工作温度: -20°C ~ 85°C
封装/外壳: 20-LSSOP(0.173",4.40mm 宽)
包装: 带卷 (TR)
Ordering number : ENA1159
LV5050NV
Bi-CMOS IC
DC / DC Converter Controller
http://onsemi.com
Overview
The LV5050NV is a high efficiency DC/DC converter controller IC adopting a synchronous rectifying system.
Incorporating numerous functions on a single chip with easy external setting, it can be used for a wide
variety of applications. This device is optimal for use in internal power supply systems which are used in electronic
devices, LCD-TVs, DVD recorders, etc.
Functions
? Step-down DC/DC converter controller with 1-channel
? Input UVLO circuit,
? Built-in over current detection function
? Built-in soft-start/soft-stop function
? Built-in start-up delay circuit
? Built-in output voltage monitor function (Under voltage protection with power good and timer latch)
? Synchronized operation is possible between different devices.
Specifications
Absolute Maximum Ratings at Ta = 25 ° C
Parameter
Supply voltage
Symbol
VIN
Conditions
Ratings
18
Unit
V
Allowable power dissipation
Junction temperature
Operating temperature
Storage temperature
Pd max
Tj
Topr
Tstg
Mounted on a specified board *1
800
150
-20 to 85
-55 to +150
mW
° C
° C
° C
Allowable terminal voltage *2
1
2
HDRV,CBOOT
Between
28
6.5
V
V
HDRV, CBOOT and SW
3
4
5
VIN, ILIM, RSNS, SW, PGOOD
VLIN5, VDD, LDRV
COMP, FB, SS, UV_DELAY
18
6.5
VLIN5+0.3
V
V
V
TD, CT, CLKO
*1: Specified board: 114.3mm × 76.1mm × 1.6 mm, glass epoxy board.
*2: The Allowable Terminal Voltage, the SGND+PGND pin becomes a standard except for No.2 of the allowable terminal voltage about No.2 of
the allowable terminal voltage, the SW pin becomes a standard.
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating
Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.
Semiconductor Components Industries, LLC, 2013
August, 2013
D1208 MS 20080356-S00007 No.A1159-1/7
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