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参数资料
| 型号： | MAX19710ETN+ |
| 厂商： | Maxim Integrated Products |
| 文件页数： | 27/37页 |
| 文件大小： | 0K |
| 描述： | IC ANLG FRONT END 7.5MSPS 56TQFN |
| 产品变化通告： | Product Discontinuation 09/Jun/2011 |
| 标准包装： | 43 |
| 位数： | 10 |
| 通道数： | 2 |
| 功率（瓦特）： | 30mW |
| 电压 - 电源，模拟： | 3V |
| 电压 - 电源，数字： | 3V |
| 封装/外壳： | 56-WFQFN 裸露焊盘 |
| 供应商设备封装： | 56-TQFN-EP（7x7） |
| 包装： | 管件 |
| 产品目录页面： | 1398 (CN2011-ZH PDF) |
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33
MAX19710
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between an
actual step width and the ideal value of 1 LSB. A DNL
error specification of less than 1 LSB guarantees no
missing codes (ADC) and a monotonic transfer function
(ADC and DAC) (DAC Figure 14b).
ADC Offset Error
Ideally, the midscale transition occurs at 0.5 LSB above
midscale. The offset error is the amount of deviation
between the measured transition point and the ideal
transition point.
DAC Offset Error
Offset error (Figure 14a) is the difference between the
ideal and actual offset point. The offset point is the out-
put value when the digital input is midscale. This error
affects all codes by the same amount and usually can
be compensated by trimming.
ADC Gain Error
Ideally, the ADC full-scale transition occurs at 1.5 LSB
below full scale. The gain error is the amount of devia-
tion between the measured transition point and the
ideal transition point with the offset error removed.
ADC Dynamic Parameter Definitions
Aperture Jitter
Figure 15 shows the aperture jitter (tAJ), which is the
sample-to-sample variation in the aperture delay.
Aperture Delay
Aperture delay (tAD) is the time defined between the
rising edge of the sampling clock and the instant when
an actual sample is taken (Figure 15).
Signal-to-Noise Ratio (SNR)
For a waveform perfectly reconstructed from digital
samples, the theoretical maximum SNR is the ratio of
the full-scale analog input (RMS value) to the RMS
quantization error (residual error) and results directly
from the ADC’s resolution (N bits):
SNR(max) = 6.02 x N + 1.76
(in dB)
In reality, there are other noise sources besides quanti-
zation noise: thermal noise, reference noise, clock jitter,
etc. SNR is computed by taking the ratio of the RMS
signal to the RMS noise. RMS noise includes all spec-
tral components to the Nyquist frequency excluding the
fundamental, the first five harmonics, and the DC offset.
Signal-to-Noise and Distortion (SINAD)
SINAD is computed by taking the ratio of the RMS sig-
nal to the RMS noise. RMS noise includes all spectral
HOLD
ANALOG
INPUT
SAMPLED
DATA (T/H)
T/H
tAD
tAJ
TRACK
CLK
Figure 15. T/H Aperture Timing
0
2
1
4
3
7
6
5
000
010
001
011
100
101
110
AT STEP
011 (0.5 LSB)
AT STEP
001 (0.25 LSB)
111
DIGITAL INPUT CODE
ANALOG
OUTPUT
VALUE
Figure 14a. Integral Nonlinearity
0
2
1
4
3
6
5
000
010
001
011
100
101
DIFFERENTIAL LINEARITY
ERROR (-0.25 LSB)
DIFFERENTIAL
LINEARITY ERROR (+0.25 LSB)
1 LSB
DIGITAL INPUT CODE
ANALOG
OUTPUT
VALUE
Figure 14b. Differential Nonlinearity
10-Bit, 7.5Msps, Full-Duplex
Analog Front-End
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33
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相关代理商/技术参数 |
参数描述 |
|---|---|
| MAX19710ETN+ | 功能描述:ADC / DAC多通道 7.5Msps CODEC/AFE Full Duplex RoHS:否 制造商:Texas Instruments 转换速率: 分辨率:8 bit 接口类型:SPI 电压参考: 电源电压-最大:3.6 V 电源电压-最小:2 V 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:VQFN-40 |
| MAX19710ETN+T | 功能描述:ADC / DAC多通道 7.5Msps CODEC/AFE Full Duplex RoHS:否 制造商:Texas Instruments 转换速率: 分辨率:8 bit 接口类型:SPI 电压参考: 电源电压-最大:3.6 V 电源电压-最小:2 V 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:VQFN-40 |
| MAX19710ETN-T | 功能描述:ADC / DAC多通道 RoHS:否 制造商:Texas Instruments 转换速率: 分辨率:8 bit 接口类型:SPI 电压参考: 电源电压-最大:3.6 V 电源电压-最小:2 V 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:VQFN-40 |
| MAX19710EVCMODU+ | 功能描述:数据转换 IC 开发工具 MAX19710 Eval System RoHS:否 制造商:Texas Instruments 产品:Demonstration Kits 类型:ADC 工具用于评估:ADS130E08 接口类型:SPI 工作电源电压:- 6 V to + 6 V |
| MAX19710EVKIT | 功能描述:数据转换 IC 开发工具 RoHS:否 制造商:Texas Instruments 产品:Demonstration Kits 类型:ADC 工具用于评估:ADS130E08 接口类型:SPI 工作电源电压:- 6 V to + 6 V |
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