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参数资料
| 型号： | MC10141P |
| 厂商： | ON SEMICONDUCTOR |
| 元件分类： | 计数移位寄存器 |
| 英文描述： | 10K SERIES, 4-BIT BIDIRECTIONAL PARALLEL IN PARALLEL OUT SHIFT REGISTER, TRUE OUTPUT, PDIP16 |
| 封装： | PLASTIC, DIP-16 |
| 文件页数： | 2/8页 |
| 文件大小： | 119K |
| 代理商： | MC10141P |
MC10141
http://onsemi.com
2
SHIFT FREQUENCY TEST CIRCUIT
TEST PROCEDURES:
1.SET D1, D2, D3 = +0.31 VDC (LOGIC L)
D0 = +1.11 VDC (LOGIC H)
2.APPY CLOCK PULSE
TO SET Q0 HIGH.
3.MAINTAIN CLOCK LOW.
SET S1 = +0.31 VDC (LOGIC L)
S2 = +1.11 VDC (LOGIC H)
4. TEST SHIFT FREQUENCY
—
VIH
VIL
50-ohm termination to ground
located in each scope channel input.
INPUT
DL
Coax
Q3
Q2
Q1
Q0
C
D0
D1
D2
D3
S1
S2
VOUT
VIN
COAX
16
25 uF
1
0.1 F
8
VEE = -3.2VDC
VCC1 = VCC2
+2.0 VDC
0.1 F
PULSE GENERATOR
DR
All input and output cables to the
scope are equal lengths of 50-ohm
coaxial cable. Wire length should be
< 1/4 inch from TPin to input pin and
TPout to output pin.
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