参数资料
型号: MC10141P
厂商: ON SEMICONDUCTOR
元件分类: 计数移位寄存器
英文描述: 10K SERIES, 4-BIT BIDIRECTIONAL PARALLEL IN PARALLEL OUT SHIFT REGISTER, TRUE OUTPUT, PDIP16
封装: PLASTIC, DIP-16
文件页数: 4/8页
文件大小: 119K
代理商: MC10141P
MC10141
http://onsemi.com
4
ELECTRICAL CHARACTERISTICS (continued)
TEST VOLTAGE VALUES (Volts)
@ Test Temperature
VIHmax
VILmin
VIHAmin
VILAmax
VEE
–30
°C
–0.890
–1.890
–1.205
–1.500
–5.2
+25
°C
–0.810
–1.850
–1.105
–1.475
–5.2
+85
°C
–0.700
–1.825
–1.035
–1.440
–5.2
Pin
Under
TEST VOLTAGE APPLIED TO PINS LISTED BELOW
(V
)
Characteristic
Symbol
Under
Test
VIHmax
VILmin
VIHAmin
VILAmax
VEE
P1
P2
P3
(VCC)
Gnd
Power Supply Drain Current
IE
8
1, 16
Input Current
IinH
5
6
7
4
5
6
7
4
8
1, 16
IinL
12
4,5,6,7,9,
10,11,13
12
8
1, 16
Output Voltage
Logic 1
VOH
3
6
8
4
1, 16
Output Voltage
Logic 0
VOL
3
8
4
1, 16
Threshold Voltage
Logic 1
VOHA
(Note 1.)
3
6
Note 3.
6
7
8
4
1, 16
Threshold Voltage
Logic 0
VOLA
(Note 1.)
3
6
Note 4.
6
7
8
4
1, 16
Switching Times (50
Load)
–3.2 V
+2.0 V
Propagation Delay
Setup TIme (tsetup)
Hold Time (thold)
t4+3+
t12+4+
t10+4+
t4+12+
3
14
8
1, 16
Rise Time
(20 to 80%)
t3+
3
8
1, 16
Fall Time
(20 to 80%)
t3–
3
8
1, 16
Shift Frequency
fshift
Note 2.
8
1, 16
1. These tests to be performed in sequence as shown.
VIH
VIL
P1
VIHA
VIL
P2
VILA
VIL
P3
2. See shift frequency test circuit for test procedures.
3. Reset to zero before performing test.
4. Reset to one before performing test.
Each MECL 10,000 series circuit has been designed to meet the dc specifications shown in the test table, after thermal equilibrium has been
established. The circuit is in a test socket or mounted on a printed circuit board and transverse air flow greater than 500 linear fpm is maintained.
Outputs are terminated through a 50–ohm resistor to –2.0 volts. Test procedures are shown for only one gate. The other gates are tested in the
same manner.
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