参数资料
型号: MC34912BAC
厂商: Freescale Semiconductor
文件页数: 63/95页
文件大小: 0K
描述: IC SYSTEM BASIS CHIP LIN 32-LQFP
标准包装: 250
应用: 系统基础芯片
电流 - 电源: 4.5mA
电源电压: 5.5 V ~ 18 V
工作温度: -40°C ~ 85°C
安装类型: 表面贴装
封装/外壳: 32-LQFP
供应商设备封装: 32-LQFP(7x7)
包装: 托盘
MC33912BAC / MC34912BAC
ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
Table 36. Dynamic Electrical Characteristics (continued)
Characteristics noted under conditions 5.5 V ?? V SUP ? 18 V, -40°C ? T A ? 125°C for the 33912 and -40°C ? T A ? 85°C for the
34912, unless otherwise noted. Typical values noted reflect the approximate parameter mean at T A = 25°C under nominal
conditions, unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
LIN PHYSICAL LAYER: DRIVER CHARACTERISTICS FOR FAST SLEW RATE
LIN Fast Slew Rate (Programming mode)
SR FAST
20
V / ? s
LIN PHYSICAL LAYER: CHARACTERISTICS AND WAKE-UP TIMINGS
Propagation Delay and Symmetry (123)
? s
Propagation Delay Receiver, t REC_PD = MAX (t REC_PDR , t REC_PDF )
Symmetry of Receiver Propagation Delay t REC_PDF - t REC_PDR
t REC_PD
t REC_SYM
- 2.0
3.0
6.0
2.0
Bus Wake-up Deglitcher (Sleep and Stop modes)
t PROPWL
42
70
95
? s
Bus Wake-up Event Reported
? s
From Sleep mode (125)
From Stop mode (126)
t WAKE
t WAKE
9.0
13
1500
17
TXD Permanent Dominant State Delay
t TXDDOM
0.65
1.0
1.35
s
PULSE WIDTH MODULATION INPUT PIN (PWMIN)
PWMIN pin (127)
f PWMIN
kHz
Max. frequency to drive HS and LS output pins
-
10
-
Notes
122. V SUP from 7.0 V to 18 V, bus load R BUS and C BUS 1.0 nF / 1.0 k ? , 6.8 nF / 660 ? , 10 nF / 500 ? . Measurement thresholds: 50% of TXD
signal to LIN signal threshold defined at each parameter. See Figure 29 .
123. See Figure 32 .
124. See Figure 33 for Sleep and Figure 34 for Stop mode.
125. The measurement is done with 1μF capacitor and 0 mA current load on V DD . The value takes into account the delay to charge the
capacitor. The delay is measured between the bus wake-up threshold (V BUSWU ) rising edge of the LIN bus and when V DD reaches 3.0 V.
See Figure 33 . The delay depends of the load and capacitor on V DD .
126.
127.
In Stop mode, the delay is measured between the bus wake-up threshold (V BUSWU ) and the falling edge of the IRQ pin. See Figure 34 .
This parameter is guaranteed by process monitoring but not production tested.
33912
Analog Integrated Circuit Device Data ?
Freescale Semiconductor
63
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